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Conference Paper: A Converter Based Switching Loss Measurement Method for WBG Device

TitleA Converter Based Switching Loss Measurement Method for WBG Device
Authors
KeywordsGaN
Soft switching
Switching loss
Turn-off loss
WBG
Issue Date2023
Citation
Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC, 2023, v. 2023-March, p. 8-13 How to Cite?
AbstractWith the advent of WBG device like GaN and SiC, frequency has been pushed to very high in order to achieve the higher power density. Consequently, switching loss becomes a large part of device loss in high-frequency applications. Traditional double pulse test method is not suitable for measuring the switching loss of GaN or SiC device with very high turn-off speed. In this paper, a converter-based switching loss measurement method is proposed and demonstrated. By analyzing the total loss breakdown and measuring each component precisely, the switching loss can be calculated accurately. Using this method, the switching loss of the 600V GaN device is evaluated in soft switching up to MHz.
Persistent Identifierhttp://hdl.handle.net/10722/352362

 

DC FieldValueLanguage
dc.contributor.authorYang, Qiuzhe-
dc.contributor.authorNabih, Ahmed-
dc.contributor.authorZhang, Ruizhe-
dc.contributor.authorLi, Qiang-
dc.contributor.authorZhang, Yuhao-
dc.date.accessioned2024-12-16T03:58:28Z-
dc.date.available2024-12-16T03:58:28Z-
dc.date.issued2023-
dc.identifier.citationConference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC, 2023, v. 2023-March, p. 8-13-
dc.identifier.urihttp://hdl.handle.net/10722/352362-
dc.description.abstractWith the advent of WBG device like GaN and SiC, frequency has been pushed to very high in order to achieve the higher power density. Consequently, switching loss becomes a large part of device loss in high-frequency applications. Traditional double pulse test method is not suitable for measuring the switching loss of GaN or SiC device with very high turn-off speed. In this paper, a converter-based switching loss measurement method is proposed and demonstrated. By analyzing the total loss breakdown and measuring each component precisely, the switching loss can be calculated accurately. Using this method, the switching loss of the 600V GaN device is evaluated in soft switching up to MHz.-
dc.languageeng-
dc.relation.ispartofConference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC-
dc.subjectGaN-
dc.subjectSoft switching-
dc.subjectSwitching loss-
dc.subjectTurn-off loss-
dc.subjectWBG-
dc.titleA Converter Based Switching Loss Measurement Method for WBG Device-
dc.typeConference_Paper-
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1109/APEC43580.2023.10131509-
dc.identifier.scopuseid_2-s2.0-85162208595-
dc.identifier.volume2023-March-
dc.identifier.spage8-
dc.identifier.epage13-

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