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Conference Paper: Are re-entrants good or bad? An empirical test in Hong Kong

TitleAre re-entrants good or bad? An empirical test in Hong Kong
Authors
Issue Date2005
PublisherWorld Scientific Press.
Citation
The 6th International Conference on Tall Buildings, Hong Kong, 6-8 December 2005. In Cheung, YK and Chow, KW (Eds.), Tall Buildings: From Engineering to Sustainability, p. 1011-1016. Singapore: World Scientific Pub Co Inc, 2005 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/120318
ISBN

 

DC FieldValueLanguage
dc.contributor.authorWong, SKen_HK
dc.contributor.authorYau, Yen_HK
dc.contributor.authorCheung, AKCen_HK
dc.contributor.authorChau, KWen_HK
dc.contributor.authorHo, DCWen_HK
dc.date.accessioned2010-09-26T09:34:22Z-
dc.date.available2010-09-26T09:34:22Z-
dc.date.issued2005en_HK
dc.identifier.citationThe 6th International Conference on Tall Buildings, Hong Kong, 6-8 December 2005. In Cheung, YK and Chow, KW (Eds.), Tall Buildings: From Engineering to Sustainability, p. 1011-1016. Singapore: World Scientific Pub Co Inc, 2005en_HK
dc.identifier.isbn978-9812566201-
dc.identifier.urihttp://hdl.handle.net/10722/120318-
dc.languageengen_HK
dc.publisherWorld Scientific Press.en_HK
dc.relation.ispartofTall Buildings: From Engineering to Sustainabilityen_HK
dc.titleAre re-entrants good or bad? An empirical test in Hong Kongen_HK
dc.typeConference_Paperen_HK
dc.identifier.emailWong, SK: skwongb@hkusua.hku.hken_HK
dc.identifier.emailCheung, AKC: matsu@hkusua.hku.hken_HK
dc.identifier.emailYau, Y: yysimon@graduate.hku.hken_HK
dc.identifier.emailChau, KW: hrrbckw@hkucc.hku.hken_HK
dc.identifier.emailHo, DCW: danielho@hkucc.hku.hken_HK
dc.identifier.authorityChau, KW=rp00993en_HK
dc.identifier.authorityHo, DCW=rp01001en_HK
dc.identifier.hkuros123303en_HK
dc.identifier.hkuros118703-
dc.identifier.spage1011en_HK
dc.identifier.epage1016en_HK

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