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Patent History
- ApplicationUS 11/302048 2005-12-13
- PublicationUS 20070131453 2007-06-14
- GrantedUS 7404455 2008-07-29
Supplementary
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Citations:
- Appears in Collections:
granted patent: Automatic Spt Monitor
Title | Automatic Spt Monitor |
---|---|
Granted Patent | US 7404455 |
Granted Date | 2008-07-29 |
Priority Date | 2005-12-13 US 11/302048 |
Inventors | |
Issue Date | 2008 |
Citation | US Patent 7404455. Washington, DC: US Patent and Trademark Office (USPTO), 2008 How to Cite? |
Abstract | An Apparatus Is Used With An Impact Hammer Penetration Assemble Such As Standard Penetration Test (Spt) In Geotechnical Engineering. The Impact Hammer Penetration Assembly Comprises A Penetration Sample, A Series Of Rods Coupled Together And An Impact Hammer Apparatus. The Drop Of The Hammer From A Constant Height Hits The Coupled Rods And Sampler In Series And Forces The Sampler Deeper Into The Ground. The Apparatus Includes A Tip Depth Transducer And Sampler To Output A First Electrical Signal That Is A Function Of The Sampler Tip Position. A Shock Force Transducer Communicates The Axial Shock Force In The Rod To Output A Second Electrical Signal That Is A Function Of The Rod Shock Force And Hammer Blows.; A Shock Penetration Transducer Communicates The Movement Of The Coupled Rods And Sampler To Output A Third Electrical Signal That Is A Function Of The Sampler Penetration Due To The Hammer Blows. A Micro-Process Controller Monitors And Processes The First, Second And Third Signals In Real Time. |
Persistent Identifier | http://hdl.handle.net/10722/142201 |
References |
DC Field | Value | Language |
---|---|---|
dc.date.accessioned | 2011-10-19T06:34:53Z | - |
dc.date.available | 2011-10-19T06:34:53Z | - |
dc.date.issued | 2008 | - |
dc.identifier.citation | US Patent 7404455. Washington, DC: US Patent and Trademark Office (USPTO), 2008 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/142201 | - |
dc.description.abstract | An Apparatus Is Used With An Impact Hammer Penetration Assemble Such As Standard Penetration Test (Spt) In Geotechnical Engineering. The Impact Hammer Penetration Assembly Comprises A Penetration Sample, A Series Of Rods Coupled Together And An Impact Hammer Apparatus. The Drop Of The Hammer From A Constant Height Hits The Coupled Rods And Sampler In Series And Forces The Sampler Deeper Into The Ground. The Apparatus Includes A Tip Depth Transducer And Sampler To Output A First Electrical Signal That Is A Function Of The Sampler Tip Position. A Shock Force Transducer Communicates The Axial Shock Force In The Rod To Output A Second Electrical Signal That Is A Function Of The Rod Shock Force And Hammer Blows.; A Shock Penetration Transducer Communicates The Movement Of The Coupled Rods And Sampler To Output A Third Electrical Signal That Is A Function Of The Sampler Penetration Due To The Hammer Blows. A Micro-Process Controller Monitors And Processes The First, Second And Third Signals In Real Time. | en_HK |
dc.title | Automatic Spt Monitor | en_HK |
dc.type | Patent | en_US |
dc.identifier.email | Lee, Chack Fan:leecf@hkucc.hku.hk | en_US |
dc.identifier.email | Lee, Peter Kai Kwong: | en_US |
dc.identifier.email | Tham, Leslie George: | en_US |
dc.identifier.email | Yue, Zhong Qi:yueqzq@hkucc.hku.hk | en_US |
dc.identifier.authority | Lee, Chack Fan=rp00139 | en_US |
dc.identifier.authority | Yue, Zhong Qi=rp00209 | en_US |
dc.description.nature | published_or_final_version | - |
dc.contributor.inventor | Yue Zhong Qi | en_US |
dc.contributor.inventor | Lee, CF | en_US |
dc.contributor.inventor | Lee Peter Kai Kwong | en_US |
dc.contributor.inventor | Tham Leslie George | en_US |
patents.identifier.application | US 11/302048 | en_HK |
patents.identifier.granted | US 7404455 | en_HK |
patents.description.assignee | Univ Hong Kong [Cn] | en_HK |
patents.description.country | United States of America | en_HK |
patents.date.publication | 2007-06-14 | en_HK |
patents.date.granted | 2008-07-29 | en_HK |
dc.relation.references | US 6105690 (A) 2000-08-22 | en_HK |
dc.relation.references | US 6286613 (B1) 2001-09-11 | en_HK |
dc.relation.references | US 2003039752 (A1) 2003-02-27 | en_HK |
dc.relation.references | US 6966950 (B2) 2005-11-22 | en_HK |
dc.relation.references | US 2002043404 (A1) 2002-04-18 | en_HK |
dc.relation.references | US 2005194134 (A1) 2005-09-08 | en_HK |
dc.relation.references | US 7958936 (B2) 2011-06-14 | en_HK |
dc.relation.references | US 2002074165 (A1) 2002-06-20 | en_HK |
dc.relation.references | US 6637523 (B2) 2003-10-28 | en_HK |
patents.identifier.hkutechid | CivE-2005-00206-1 | en_US |
patents.date.application | 2005-12-13 | en_HK |
patents.date.priority | 2005-12-13 US 11/302048 | en_HK |
patents.description.cc | US | en_HK |
patents.identifier.publication | US 20070131453 | en_HK |
patents.relation.family | CN 1982645 (A) 2007-06-20 | en_HK |
patents.relation.family | US 2007131453 (A1) 2007-06-14 | en_HK |
patents.relation.family | US 7404455 (B2) 2008-07-29 | en_HK |
patents.description.kind | B2 | en_HK |
patents.type | Patent_granted | en_HK |