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Article: Comments on "Class of Cyclic-Based Estimators for Frequency-Offset Estimation of OFDM Systems"

TitleComments on "Class of Cyclic-Based Estimators for Frequency-Offset Estimation of OFDM Systems"
Authors
Issue Date2005
PublisherI E E E. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=26
Citation
Ieee Transactions On Communications, 2005, v. 53 n. 3, p. 413-414 How to Cite?
AbstractThis comment corrects several errors found in the paper, "Class of Cyclic-Based Estimators for Frequency-Offset Estimation of OFDM Systems." In addition, we show that the minimum variance unbiased estimator for frequency offset derived in the above paper is the maximum-likelihood estimator when the timing delay is perfectly known. © 2005 IEEE.
Persistent Identifierhttp://hdl.handle.net/10722/155262
ISSN
2023 Impact Factor: 7.2
2020 SCImago Journal Rankings: 1.468
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorWu, YCen_US
dc.contributor.authorSerpedin, Een_US
dc.date.accessioned2012-08-08T08:32:35Z-
dc.date.available2012-08-08T08:32:35Z-
dc.date.issued2005en_US
dc.identifier.citationIeee Transactions On Communications, 2005, v. 53 n. 3, p. 413-414en_US
dc.identifier.issn0090-6778en_US
dc.identifier.urihttp://hdl.handle.net/10722/155262-
dc.description.abstractThis comment corrects several errors found in the paper, "Class of Cyclic-Based Estimators for Frequency-Offset Estimation of OFDM Systems." In addition, we show that the minimum variance unbiased estimator for frequency offset derived in the above paper is the maximum-likelihood estimator when the timing delay is perfectly known. © 2005 IEEE.en_US
dc.languageengen_US
dc.publisherI E E E. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=26en_US
dc.relation.ispartofIEEE Transactions on Communicationsen_US
dc.titleComments on "Class of Cyclic-Based Estimators for Frequency-Offset Estimation of OFDM Systems"en_US
dc.typeArticleen_US
dc.identifier.emailWu, YC:ycwu@eee.hku.hken_US
dc.identifier.authorityWu, YC=rp00195en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1109/TCOMM.2005.843444en_US
dc.identifier.scopuseid_2-s2.0-17644389561en_US
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-17644389561&selection=ref&src=s&origin=recordpageen_US
dc.identifier.volume53en_US
dc.identifier.issue3en_US
dc.identifier.spage413en_US
dc.identifier.epage414en_US
dc.identifier.isiWOS:000228095000008-
dc.publisher.placeUnited Statesen_US
dc.identifier.scopusauthoridWu, YC=7406894786en_US
dc.identifier.scopusauthoridSerpedin, E=7003366947en_US
dc.identifier.issnl0090-6778-

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