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Article: Exchange bias effects of NiFe/NiO bilayers through ion-beam bombardment on the NiO surface

TitleExchange bias effects of NiFe/NiO bilayers through ion-beam bombardment on the NiO surface
Authors
Li, GLeung, CWShueh, CHsu, HFHuang, HRLin, KWLai, PTPong, PWT
KeywordsExchange Bias
Ion-Beam Bombardment
Magnetic Thin Films
Issue Date2013
PublisherElsevier SA. The Journal's web site is located at http://www.elsevier.com/locate/surfcoat
Citation
Surface And Coatings Technology, 2013, v. 228 n. SUPPL.1, p. S437-S441 How to Cite?
DOI: http://dx.doi.org/10.1016/j.surfcoat.2012.05.035
AbstractThe influence of ion-beam bombardment of the NiO surface on the exchange bias behavior of NiFe/NiO bilayers was systemically investigated with different bombardment energies and durations. The results show that by varying the bombardment energies, different crystallographic orientations are created which modifies the NiO spin structures. This results in the changes in the coupling type in NiO when it is in contact with the NiFe layer. The NiFe/NiO bilayers exhibited either enhanced or decreased exchange bias filed, depending on the uncompensated moments or misaligned NiO spin created by ion-beam bombardment. The variations in coercivities of NiFe/NiO bilayers imply that the NiO anisotropy could be tuned by ion-beam bombardment. © 2012 Elsevier B.V. All rights reserved.
Persistent Identifierhttp://hdl.handle.net/10722/155762
ISSN
0257-8972
2021 Impact Factor: 4.865
2020 SCImago Journal Rankings: 0.904
ISI Accession Number ID
WOS:000323628400095

 

DC FieldValueLanguage
dc.contributor.authorLi, Gen_US
dc.contributor.authorLeung, CWen_US
dc.contributor.authorShueh, Cen_US
dc.contributor.authorHsu, HFen_US
dc.contributor.authorHuang, HRen_US
dc.contributor.authorLin, KWen_US
dc.contributor.authorLai, PTen_US
dc.contributor.authorPong, PWTen_US
dc.date.accessioned2012-08-08T08:35:13Z-
dc.date.available2012-08-08T08:35:13Z-
dc.date.issued2013en_US
dc.identifier.citationSurface And Coatings Technology, 2013, v. 228 n. SUPPL.1, p. S437-S441en_US
dc.identifier.issn0257-8972en_US
dc.identifier.urihttp://hdl.handle.net/10722/155762-
dc.description.abstractThe influence of ion-beam bombardment of the NiO surface on the exchange bias behavior of NiFe/NiO bilayers was systemically investigated with different bombardment energies and durations. The results show that by varying the bombardment energies, different crystallographic orientations are created which modifies the NiO spin structures. This results in the changes in the coupling type in NiO when it is in contact with the NiFe layer. The NiFe/NiO bilayers exhibited either enhanced or decreased exchange bias filed, depending on the uncompensated moments or misaligned NiO spin created by ion-beam bombardment. The variations in coercivities of NiFe/NiO bilayers imply that the NiO anisotropy could be tuned by ion-beam bombardment. © 2012 Elsevier B.V. All rights reserved.en_US
dc.languageengen_US
dc.publisherElsevier SA. The Journal's web site is located at http://www.elsevier.com/locate/surfcoaten_US
dc.relation.ispartofSurface and Coatings Technologyen_US
dc.subjectExchange Biasen_US
dc.subjectIon-Beam Bombardmenten_US
dc.subjectMagnetic Thin Filmsen_US
dc.titleExchange bias effects of NiFe/NiO bilayers through ion-beam bombardment on the NiO surfaceen_US
dc.typeArticleen_US
dc.identifier.emailPong, PWT:ppong@eee.hku.hken_US
dc.identifier.authorityPong, PWT=rp00217en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1016/j.surfcoat.2012.05.035en_US
dc.identifier.scopuseid_2-s2.0-84879793158en_US
dc.identifier.hkuros207624-
dc.identifier.hkuros227862-
dc.identifier.volume228-
dc.identifier.issueSUPPL.1-
dc.identifier.spageS437-
dc.identifier.epageS441-
dc.identifier.isiWOS:000323628400095-
dc.publisher.placeSwitzerlanden_US
dc.identifier.scopusauthoridLi, G=54976832400en_US
dc.identifier.scopusauthoridLeung, CW=55192281000en_US
dc.identifier.scopusauthoridShueh, C=55179308500en_US
dc.identifier.scopusauthoridHsu, HF=26537502100en_US
dc.identifier.scopusauthoridHuang, HR=36051652500en_US
dc.identifier.scopusauthoridLin, KW=7403967959en_US
dc.identifier.scopusauthoridLai, PT=55224724400en_US
dc.identifier.scopusauthoridPong, PWT=24071267900en_US
dc.identifier.citeulike10687210-
dc.identifier.issnl0257-8972-

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