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Conference Paper: Defect detection on fabrics by matched filters

TitleDefect detection on fabrics by matched filters
Authors
Lee, TCPang, G
Issue Date2004
Citation
Ieee Region 10 Annual International Conference, Proceedings/Tencon, 2004, v. B, p. B89-B92 How to Cite?
AbstractAs textile inspection plays an important role in creating quality products, this paper presents the design of 2D matched filters for fabric defect detection. The filters characterize specific texture properties of fabric defects and are implemented in a multi-channel filtering bank. Five matched masks for detecting the Wrong Draw texture, the Mispick texture, the horizontal edges, the bars structure and the filled regions on fabric images are designed. The proposed method demonstrated 96% of defects successfully detected and 6% false alarm rate. © 2004 IEEE.
Persistent Identifierhttp://hdl.handle.net/10722/158424
References
References in Scopus

 

DC FieldValueLanguage
dc.contributor.authorLee, TCen_US
dc.contributor.authorPang, Gen_US
dc.date.accessioned2012-08-08T08:59:33Z-
dc.date.available2012-08-08T08:59:33Z-
dc.date.issued2004en_US
dc.identifier.citationIeee Region 10 Annual International Conference, Proceedings/Tencon, 2004, v. B, p. B89-B92en_US
dc.identifier.urihttp://hdl.handle.net/10722/158424-
dc.description.abstractAs textile inspection plays an important role in creating quality products, this paper presents the design of 2D matched filters for fabric defect detection. The filters characterize specific texture properties of fabric defects and are implemented in a multi-channel filtering bank. Five matched masks for detecting the Wrong Draw texture, the Mispick texture, the horizontal edges, the bars structure and the filled regions on fabric images are designed. The proposed method demonstrated 96% of defects successfully detected and 6% false alarm rate. © 2004 IEEE.en_US
dc.languageengen_US
dc.relation.ispartofIEEE Region 10 Annual International Conference, Proceedings/TENCONen_US
dc.titleDefect detection on fabrics by matched filtersen_US
dc.typeConference_Paperen_US
dc.identifier.emailPang, G:gpang@eee.hku.hken_US
dc.identifier.authorityPang, G=rp00162en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.scopuseid_2-s2.0-27944444158en_US
dc.identifier.hkuros106566-
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-27944444158&selection=ref&src=s&origin=recordpageen_US
dc.identifier.volumeBen_US
dc.identifier.spageB89en_US
dc.identifier.epageB92en_US
dc.identifier.scopusauthoridLee, TC=9333545800en_US
dc.identifier.scopusauthoridPang, G=7103393283en_US

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