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Patent History
- ApplicationUS 12/816218 2010-06-15
- PublicationUS 20100322505 2010-12-23
- GrantedUS 8053724 2011-11-08
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granted patent: Real-Time S-Parameter Imager
Title | Real-Time S-Parameter Imager |
---|---|
Granted Patent | US 8053724 |
Granted Date | 2011-11-08 |
Priority Date | 2010-06-15 US 12/816218 2007-05-04 US 11/797621 2004-07-14 US 11/890723 |
Inventors | |
Issue Date | 2011 |
Citation | US Patent 8053724. Washington, DC: US Patent and Trademark Office (USPTO), 2011 How to Cite? |
Abstract | An Instrumentation Setup Is Provided To Process Electronic Signals In A Positron Imager Functioning In Two Different Modes Of Operations For Scanning Both Bulk And Thin Film Materials. According To One Part Of An Implementation, An Instrumentation Setup Comprises An Xy-Rastering Stepper Motor Apparatus Coupled With Lvdts (Linear Variable Differential Transformers), And Nuclear Signal Processing And High Speed Data Acquisition Sections. Imaging Of Bulk Material Samples May Be Enabled By Scanning A Positron Point Source Across A Surface Of Samples. In Another Part Of The Irnplenientation, The Instrumentation Setup May Comprise An Electromagnetic Deflection Control Arrangement In Conjunction With A Guided Monoenergetic Positron Beam Together With Nuclear Signal Processing And Data Acquisition Arrangements.; This Part Of The Implementation May Scan And Produce Images For Thin Film Samples. The Instrumentation Setup Is Capable Of Producing High Quality Real-Time S-Parameter Images. |
Persistent Identifier | http://hdl.handle.net/10722/173823 |
References |
DC Field | Value | Language |
---|---|---|
dc.date.accessioned | 2012-11-02T06:19:27Z | - |
dc.date.available | 2012-11-02T06:19:27Z | - |
dc.date.issued | 2011 | - |
dc.identifier.citation | US Patent 8053724. Washington, DC: US Patent and Trademark Office (USPTO), 2011 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/173823 | - |
dc.description.abstract | An Instrumentation Setup Is Provided To Process Electronic Signals In A Positron Imager Functioning In Two Different Modes Of Operations For Scanning Both Bulk And Thin Film Materials. According To One Part Of An Implementation, An Instrumentation Setup Comprises An Xy-Rastering Stepper Motor Apparatus Coupled With Lvdts (Linear Variable Differential Transformers), And Nuclear Signal Processing And High Speed Data Acquisition Sections. Imaging Of Bulk Material Samples May Be Enabled By Scanning A Positron Point Source Across A Surface Of Samples. In Another Part Of The Irnplenientation, The Instrumentation Setup May Comprise An Electromagnetic Deflection Control Arrangement In Conjunction With A Guided Monoenergetic Positron Beam Together With Nuclear Signal Processing And Data Acquisition Arrangements.; This Part Of The Implementation May Scan And Produce Images For Thin Film Samples. The Instrumentation Setup Is Capable Of Producing High Quality Real-Time S-Parameter Images. | en_HK |
dc.title | Real-Time S-Parameter Imager | en_HK |
dc.type | Patent | en_US |
dc.identifier.authority | Beling, CD:rp00660 | - |
dc.description.nature | published_or_final_version | en_US |
dc.contributor.inventor | Naik, Sabitru Pranab | - |
dc.contributor.inventor | Beling, CD | - |
dc.contributor.inventor | Fung, H Y Stevenson | - |
patents.identifier.application | US 12/816218 | en_HK |
patents.identifier.granted | US 8053724 | en_HK |
patents.description.assignee | Univ Hong Kong [Hk] | en_HK |
patents.description.country | United States of America | en_HK |
patents.date.publication | 2010-12-23 | en_HK |
patents.date.granted | 2011-11-08 | en_HK |
dc.relation.references | US 5870051 (A) 1999-02-09 | en_HK |
dc.relation.references | US 5873054 (A) 1999-02-16 | en_HK |
dc.relation.references | US 3825759 (A) 1974-07-23 | en_HK |
dc.relation.references | US 4064438 (A) 1977-12-20 | en_HK |
dc.relation.references | US 6043489 (A) 2000-03-28 | en_HK |
dc.relation.references | US 2006011831 (A1) 2006-01-19 | en_HK |
dc.relation.references | US 7420166 (B2) 2008-09-02 | en_HK |
dc.relation.references | US 2007265789 (A1) 2007-11-15 | en_HK |
dc.relation.references | US 7781732 (B2) 2010-08-24 | en_HK |
patents.identifier.hkutechid | Phy-2004-00149-3 | en_HK |
patents.date.application | 2010-06-15 | en_HK |
patents.date.priority | 2010-06-15 US 12/816218 | en_HK |
patents.date.priority | 2007-05-04 US 11/797621 | en_HK |
patents.date.priority | 2004-07-14 US 11/890723 | en_HK |
patents.description.cc | US | en_HK |
patents.identifier.publication | US 20100322505 | en_HK |
patents.relation.family | US 2006011831 (A1) 2006-01-19 | en_HK |
patents.relation.family | US 7420166 (B2) 2008-09-02 | en_HK |
patents.relation.family | US 2007265789 (A1) 2007-11-15 | en_HK |
patents.relation.family | US 7781732 (B2) 2010-08-24 | en_HK |
patents.relation.family | US 2010322505 (A1) 2010-12-23 | en_HK |
patents.relation.family | US 8053724 (B2) 2011-11-08 | en_HK |
patents.description.kind | B2 | en_HK |
patents.type | Patent_granted | en_HK |