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  Patent History
  • Application
    US 10/917391 2004-08-13
  • Publication
    US 2005066702 2005-03-31
  Patent Family
Supplementary

published patent: Method for measuring elastic properties

TitleMethod for measuring elastic properties
Priority Date2004-08-13 US 10/917391
2002-11-20 US 10/300323
2001-11-20 US 09/331751P
Inventors
Feng GangNgan, AHW
Issue Date2005
Citation
US Published patent application US 2005066702. Washington, DC: US Patent and Trademark Office (USPTO), 2005 How to Cite?
AbstractThis invention relates to a method for measuring elastic modulus of a sample object. This invention also relates to a method for correcting creep effects in the modulus measurement. The error due to creep in the apparent contact compliance is equal to the ratio of the indenter displacement rate at the end of the load hold to the unloading rate. Determination of this error term and deduction of it from the measured contact compliance can be easily done at a low cost by modifying the data analysis software in any commercial depth-sensing indentation system.
Persistent Identifierhttp://hdl.handle.net/10722/176890

 

DC FieldValueLanguage
dc.date.accessioned2012-11-30T08:38:40Z-
dc.date.available2012-11-30T08:38:40Z-
dc.date.issued2005-
dc.identifier.citationUS Published patent application US 2005066702. Washington, DC: US Patent and Trademark Office (USPTO), 2005en_HK
dc.identifier.urihttp://hdl.handle.net/10722/176890-
dc.description.abstractThis invention relates to a method for measuring elastic modulus of a sample object. This invention also relates to a method for correcting creep effects in the modulus measurement. The error due to creep in the apparent contact compliance is equal to the ratio of the indenter displacement rate at the end of the load hold to the unloading rate. Determination of this error term and deduction of it from the measured contact compliance can be easily done at a low cost by modifying the data analysis software in any commercial depth-sensing indentation system.en_HK
dc.titleMethod for measuring elastic propertiesen_HK
dc.typePatenten_US
dc.description.naturepublished_or_final_versionen_US
dc.contributor.inventorFeng Gangen_HK
dc.contributor.inventorNgan, AHWen_HK
patents.identifier.applicationUS 10/917391en_HK
patents.description.assigneeFENG GANG, ; NGAN ALFONSO HING WANen_HK
patents.description.countryUnited States of Americaen_HK
patents.date.publication2005-03-31en_HK
patents.date.application2004-08-13en_HK
patents.date.priority2004-08-13 US 10/917391en_HK
patents.date.priority2002-11-20 US 10/300323en_HK
patents.date.priority2001-11-20 US 09/331751Pen_HK
patents.description.ccUSen_HK
patents.identifier.publicationUS 2005066702en_HK
patents.relation.familyEP 1314970 (A2) 2003-05-28en_HK
patents.relation.familyUS 2003094034 (A1) 2003-05-22en_HK
patents.relation.familyUS 6883367 (B2) 2005-04-26en_HK
patents.relation.familyUS 2005066702 (A1) 2005-03-31en_HK
patents.description.kindA1en_HK
patents.typePatent_publisheden_HK

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