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- Publisher Website: 10.1002/mop.23324
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Article: A quantitative study on the low frequency breakdown of EFIE
Title | A quantitative study on the low frequency breakdown of EFIE |
---|---|
Authors | |
Keywords | Efie Full-Field Regime Low Frequency Breakdown Rwg |
Issue Date | 2008 |
Publisher | John Wiley & Sons, Inc. The Journal's web site is located at http://www3.interscience.wiley.com/cgi-bin/jhome/37176 |
Citation | Microwave And Optical Technology Letters, 2008, v. 50 n. 5, p. 1159-1162 How to Cite? |
Abstract | A quantitative study is presented for the low frequency breakdown of the electric-field integral equation (EFIE) with the Rao-Wilton-Glisson basis function. The low frequency limit is ascertained hereby. Numerical experiments validate the conclusion. The line testing method is also compared with the Galerkin testing to dispel the misconception in the literature. The study thus provides a guideline for the application of EFIE in the full-field regime. © 2008 Wiley Periodicals, Inc. |
Persistent Identifier | http://hdl.handle.net/10722/182745 |
ISSN | 2023 Impact Factor: 1.0 2023 SCImago Journal Rankings: 0.376 |
ISI Accession Number ID |
DC Field | Value | Language |
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dc.contributor.author | Qian, ZG | en_US |
dc.contributor.author | Chew, WC | en_US |
dc.date.accessioned | 2013-05-02T05:16:40Z | - |
dc.date.available | 2013-05-02T05:16:40Z | - |
dc.date.issued | 2008 | en_US |
dc.identifier.citation | Microwave And Optical Technology Letters, 2008, v. 50 n. 5, p. 1159-1162 | en_US |
dc.identifier.issn | 0895-2477 | en_US |
dc.identifier.uri | http://hdl.handle.net/10722/182745 | - |
dc.description.abstract | A quantitative study is presented for the low frequency breakdown of the electric-field integral equation (EFIE) with the Rao-Wilton-Glisson basis function. The low frequency limit is ascertained hereby. Numerical experiments validate the conclusion. The line testing method is also compared with the Galerkin testing to dispel the misconception in the literature. The study thus provides a guideline for the application of EFIE in the full-field regime. © 2008 Wiley Periodicals, Inc. | en_US |
dc.language | eng | en_US |
dc.publisher | John Wiley & Sons, Inc. The Journal's web site is located at http://www3.interscience.wiley.com/cgi-bin/jhome/37176 | en_US |
dc.relation.ispartof | Microwave and Optical Technology Letters | en_US |
dc.subject | Efie | en_US |
dc.subject | Full-Field Regime | en_US |
dc.subject | Low Frequency Breakdown | en_US |
dc.subject | Rwg | en_US |
dc.title | A quantitative study on the low frequency breakdown of EFIE | en_US |
dc.type | Article | en_US |
dc.identifier.email | Chew, WC: wcchew@hku.hk | en_US |
dc.identifier.authority | Chew, WC=rp00656 | en_US |
dc.description.nature | link_to_subscribed_fulltext | en_US |
dc.identifier.doi | 10.1002/mop.23324 | en_US |
dc.identifier.scopus | eid_2-s2.0-43049103445 | en_US |
dc.identifier.volume | 50 | en_US |
dc.identifier.issue | 5 | en_US |
dc.identifier.spage | 1159 | en_US |
dc.identifier.epage | 1162 | en_US |
dc.identifier.isi | WOS:000255081700009 | - |
dc.publisher.place | United States | en_US |
dc.identifier.scopusauthorid | Qian, ZG=9043842600 | en_US |
dc.identifier.scopusauthorid | Chew, WC=36014436300 | en_US |
dc.identifier.issnl | 0895-2477 | - |