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Article: A quantitative study on the low frequency breakdown of EFIE

TitleA quantitative study on the low frequency breakdown of EFIE
Authors
Qian, ZGChew, WC
KeywordsEfie
Full-Field Regime
Low Frequency Breakdown
Rwg
Issue Date2008
PublisherJohn Wiley & Sons, Inc. The Journal's web site is located at http://www3.interscience.wiley.com/cgi-bin/jhome/37176
Citation
Microwave And Optical Technology Letters, 2008, v. 50 n. 5, p. 1159-1162 How to Cite?
DOI: http://dx.doi.org/10.1002/mop.23324
AbstractA quantitative study is presented for the low frequency breakdown of the electric-field integral equation (EFIE) with the Rao-Wilton-Glisson basis function. The low frequency limit is ascertained hereby. Numerical experiments validate the conclusion. The line testing method is also compared with the Galerkin testing to dispel the misconception in the literature. The study thus provides a guideline for the application of EFIE in the full-field regime. © 2008 Wiley Periodicals, Inc.
Persistent Identifierhttp://hdl.handle.net/10722/182745
ISSN
0895-2477
2021 Impact Factor: 1.311
2020 SCImago Journal Rankings: 0.304
ISI Accession Number ID
WOS:000255081700009

 

DC FieldValueLanguage
dc.contributor.authorQian, ZGen_US
dc.contributor.authorChew, WCen_US
dc.date.accessioned2013-05-02T05:16:40Z-
dc.date.available2013-05-02T05:16:40Z-
dc.date.issued2008en_US
dc.identifier.citationMicrowave And Optical Technology Letters, 2008, v. 50 n. 5, p. 1159-1162en_US
dc.identifier.issn0895-2477en_US
dc.identifier.urihttp://hdl.handle.net/10722/182745-
dc.description.abstractA quantitative study is presented for the low frequency breakdown of the electric-field integral equation (EFIE) with the Rao-Wilton-Glisson basis function. The low frequency limit is ascertained hereby. Numerical experiments validate the conclusion. The line testing method is also compared with the Galerkin testing to dispel the misconception in the literature. The study thus provides a guideline for the application of EFIE in the full-field regime. © 2008 Wiley Periodicals, Inc.en_US
dc.languageengen_US
dc.publisherJohn Wiley & Sons, Inc. The Journal's web site is located at http://www3.interscience.wiley.com/cgi-bin/jhome/37176en_US
dc.relation.ispartofMicrowave and Optical Technology Lettersen_US
dc.subjectEfieen_US
dc.subjectFull-Field Regimeen_US
dc.subjectLow Frequency Breakdownen_US
dc.subjectRwgen_US
dc.titleA quantitative study on the low frequency breakdown of EFIEen_US
dc.typeArticleen_US
dc.identifier.emailChew, WC: wcchew@hku.hken_US
dc.identifier.authorityChew, WC=rp00656en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1002/mop.23324en_US
dc.identifier.scopuseid_2-s2.0-43049103445en_US
dc.identifier.volume50en_US
dc.identifier.issue5en_US
dc.identifier.spage1159en_US
dc.identifier.epage1162en_US
dc.identifier.isiWOS:000255081700009-
dc.publisher.placeUnited Statesen_US
dc.identifier.scopusauthoridQian, ZG=9043842600en_US
dc.identifier.scopusauthoridChew, WC=36014436300en_US
dc.identifier.issnl0895-2477-

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