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Article: A Systematic Electromagnetic-Circuit Method for EMI Analysis of Coupled Interconnects on Dispersive Dielectrics

TitleA Systematic Electromagnetic-Circuit Method for EMI Analysis of Coupled Interconnects on Dispersive Dielectrics
Authors
Tang, MLu, J.Q.Mao, J.F.Jiang, L
KeywordsElectromagnetic interference (EMI)
finite difference time domain (FDTD)
frequency-dependent parameters
interconnects
waveform relaxation
Issue Date2013
Citation
IEEE Transactions on Microwave Theory and Techniques, 2013, v. 61, p. 1-13 How to Cite?
DOI: http://dx.doi.org/10.1109/TMTT.2012.2220562
Persistent Identifierhttp://hdl.handle.net/10722/185863
ISSN
0018-9480
2021 Impact Factor: 4.381
2020 SCImago Journal Rankings: 1.372
ISI Accession Number ID
WOS:000313940300001

 

DC FieldValueLanguage
dc.contributor.authorTang, Men_US
dc.contributor.authorLu, J.Q.en_US
dc.contributor.authorMao, J.F.en_US
dc.contributor.authorJiang, Len_US
dc.date.accessioned2013-08-20T11:44:03Z-
dc.date.available2013-08-20T11:44:03Z-
dc.date.issued2013en_US
dc.identifier.citationIEEE Transactions on Microwave Theory and Techniques, 2013, v. 61, p. 1-13en_US
dc.identifier.issn0018-9480-
dc.identifier.urihttp://hdl.handle.net/10722/185863-
dc.languageengen_US
dc.relation.ispartofIEEE Transactions on Microwave Theory and Techniquesen_US
dc.subjectElectromagnetic interference (EMI)-
dc.subjectfinite difference time domain (FDTD)-
dc.subjectfrequency-dependent parameters-
dc.subjectinterconnects-
dc.subjectwaveform relaxation-
dc.titleA Systematic Electromagnetic-Circuit Method for EMI Analysis of Coupled Interconnects on Dispersive Dielectricsen_US
dc.typeArticleen_US
dc.identifier.emailTang, M: tm222@hku.hken_US
dc.identifier.emailJiang, L: jianglj@hku.hken_US
dc.identifier.authorityJiang, L=rp01338en_US
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1109/TMTT.2012.2220562-
dc.identifier.scopuseid_2-s2.0-84872945904-
dc.identifier.hkuros218846en_US
dc.identifier.volume61en_US
dc.identifier.spage1en_US
dc.identifier.epage13en_US
dc.identifier.eissn1557-9670-
dc.identifier.isiWOS:000313940300001-
dc.identifier.issnl0018-9480-

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