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Article: The Effect of Single Crystalline Substrates and Ion-Beam Bombardment on Exchange Bias in Nanocrystalline NiO/Ni80Fe20 Bilayers

TitleThe Effect of Single Crystalline Substrates and Ion-Beam Bombardment on Exchange Bias in Nanocrystalline NiO/Ni80Fe20 Bilayers
Authors
Cortie, DShueh, CPong, PWTLin, KWKlose, Fvan Lierop, J
KeywordsExchange bias
Ion-beam modification
Issue Date2014
Citation
IEEE Transactions on Magnetics, 2014, v. 50 n. 1, article no. 2300904 How to Cite?
DOI: http://dx.doi.org/10.1109/TMAG.2013.2274654
Persistent Identifierhttp://hdl.handle.net/10722/185890
ISSN
0018-9464
2021 Impact Factor: 1.848
2020 SCImago Journal Rankings: 0.620
ISI Accession Number ID
WOS:000330026800074

 

DC FieldValueLanguage
dc.contributor.authorCortie, Den_US
dc.contributor.authorShueh, Cen_US
dc.contributor.authorPong, PWTen_US
dc.contributor.authorLin, KWen_US
dc.contributor.authorKlose, Fen_US
dc.contributor.authorvan Lierop, Jen_US
dc.date.accessioned2013-08-20T11:44:17Z-
dc.date.available2013-08-20T11:44:17Z-
dc.date.issued2014-
dc.identifier.citationIEEE Transactions on Magnetics, 2014, v. 50 n. 1, article no. 2300904en_US
dc.identifier.issn0018-9464-
dc.identifier.urihttp://hdl.handle.net/10722/185890-
dc.languageengen_US
dc.relation.ispartofIEEE Transactions on Magneticsen_US
dc.subjectExchange bias-
dc.subjectIon-beam modification-
dc.titleThe Effect of Single Crystalline Substrates and Ion-Beam Bombardment on Exchange Bias in Nanocrystalline NiO/Ni80Fe20 Bilayersen_US
dc.typeArticleen_US
dc.identifier.emailPong, PWT: ppong@eee.hku.hken_US
dc.identifier.authorityPong, PWT=rp00217en_US
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1109/TMAG.2013.2274654-
dc.identifier.scopuseid_2-s2.0-84904319212-
dc.identifier.hkuros219744en_US
dc.identifier.eissn1941-0069-
dc.identifier.isiWOS:000330026800074-
dc.identifier.issnl0018-9464-

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