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Article: Charge-Trapping Characteristics of BaTiO3 with and without Nitridation for Nonvolatile Memory Applications
Title | Charge-Trapping Characteristics of BaTiO3 with and without Nitridation for Nonvolatile Memory Applications |
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Authors | |
Keywords | BaTiO3 Charge-trapping MONOS Nitrided Nonvolatile memory |
Issue Date | 2014 |
Publisher | Pergamon. The Journal's web site is located at http://www.elsevier.com/locate/microrel |
Citation | Microelectronics Reliability, 2014, v. 54 n. 11, p. 2388-2391 How to Cite? |
Persistent Identifier | http://hdl.handle.net/10722/217021 |
ISSN | 2023 Impact Factor: 1.6 2023 SCImago Journal Rankings: 0.394 |
ISI Accession Number ID |
DC Field | Value | Language |
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dc.contributor.author | Huang, XD | - |
dc.contributor.author | Shi, RP | - |
dc.contributor.author | Leung, CH | - |
dc.contributor.author | Lai, PT | - |
dc.date.accessioned | 2015-09-18T05:46:13Z | - |
dc.date.available | 2015-09-18T05:46:13Z | - |
dc.date.issued | 2014 | - |
dc.identifier.citation | Microelectronics Reliability, 2014, v. 54 n. 11, p. 2388-2391 | - |
dc.identifier.issn | 0026-2714 | - |
dc.identifier.uri | http://hdl.handle.net/10722/217021 | - |
dc.language | eng | - |
dc.publisher | Pergamon. The Journal's web site is located at http://www.elsevier.com/locate/microrel | - |
dc.relation.ispartof | Microelectronics Reliability | - |
dc.rights | © 2014. This manuscript version is made available under the CC-BY-NC-ND 4.0 license http://creativecommons.org/licenses/by-nc-nd/4.0/ | - |
dc.rights | This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License. | - |
dc.subject | BaTiO3 | - |
dc.subject | Charge-trapping | - |
dc.subject | MONOS | - |
dc.subject | Nitrided | - |
dc.subject | Nonvolatile memory | - |
dc.title | Charge-Trapping Characteristics of BaTiO3 with and without Nitridation for Nonvolatile Memory Applications | - |
dc.type | Article | - |
dc.identifier.email | Leung, CH: hreelch@HKUCC.hku.hk | - |
dc.identifier.email | Lai, PT: laip@eee.hku.hk | - |
dc.identifier.authority | Leung, CH=rp00146 | - |
dc.identifier.authority | Lai, PT=rp00130 | - |
dc.description.nature | postprint | - |
dc.identifier.doi | 10.1016/j.microrel.2014.05.002 | - |
dc.identifier.scopus | eid_2-s2.0-84911366732 | - |
dc.identifier.hkuros | 253923 | - |
dc.identifier.volume | 54 | - |
dc.identifier.issue | 11 | - |
dc.identifier.spage | 2388 | - |
dc.identifier.epage | 2391 | - |
dc.identifier.isi | WOS:000346212900008 | - |
dc.publisher.place | United Kingdom | - |
dc.identifier.issnl | 0026-2714 | - |