File Download

There are no files associated with this item.

  Links for fulltext
     (May Require Subscription)
Supplementary

Article: Characteristic mode and reduced order modeling at low frequencies

TitleCharacteristic mode and reduced order modeling at low frequencies
Authors
KeywordsAdmittance extraction
characteristic mode analysis (CMA)
eigenvalue decomposition (EVD)
low frequency (LF)
reduced order modeling
Issue Date2017
PublisherIEEE. The Journal's web site is located at http://cpmt.ieee.org/transactions-on-cpmt.html
Citation
IEEE Transactions on Components, Packaging and Manufacturing Technology, 2017, v. 7, p. 669-677 How to Cite?
AbstractRecent resurgence of interest in characteristic mode analysis (CMA) significantly enriches the tool set for the analysis and synthesis of complicated scattering and radiating systems. The theory of CM was first introduced by Garbacz and Turpin [1] to diagonalize the scattering matrix of a conducting object. Later, it was refined by Harrington and Mautz [2] to form a weighted eigenvalue problem by invoking the impedance operator, which relates the induced surface current to the tangent component of the incident electric field on the body surface. Since its inception in the early 1970s, CMA has been mainly investigated in the resonance regime. Although CMA has been adopted in small antenna design where a small number of modal currents are the major contributors of the radiation field [3], it is less well known how CMs behave at even lower frequencies. Only a few works can be found dealing with low-frequency (LF) CMA in the literature, e.g., Schuman and Harrington [4] studied the LF expansion for CMs of conducting bodies with a perturbation approach. Regarding aperture coupling problems, Leviatan [5] researched on LF CMs for the equivalent magnetic current using generalized admittance operators.
Persistent Identifierhttp://hdl.handle.net/10722/247443
ISSN
2023 Impact Factor: 2.3
2023 SCImago Journal Rankings: 0.562
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorDAI, Q-
dc.contributor.authorGAN, H-
dc.contributor.authorLiu, Q-
dc.contributor.authorChew, WC-
dc.date.accessioned2017-10-18T08:27:20Z-
dc.date.available2017-10-18T08:27:20Z-
dc.date.issued2017-
dc.identifier.citationIEEE Transactions on Components, Packaging and Manufacturing Technology, 2017, v. 7, p. 669-677-
dc.identifier.issn2156-3950-
dc.identifier.urihttp://hdl.handle.net/10722/247443-
dc.description.abstractRecent resurgence of interest in characteristic mode analysis (CMA) significantly enriches the tool set for the analysis and synthesis of complicated scattering and radiating systems. The theory of CM was first introduced by Garbacz and Turpin [1] to diagonalize the scattering matrix of a conducting object. Later, it was refined by Harrington and Mautz [2] to form a weighted eigenvalue problem by invoking the impedance operator, which relates the induced surface current to the tangent component of the incident electric field on the body surface. Since its inception in the early 1970s, CMA has been mainly investigated in the resonance regime. Although CMA has been adopted in small antenna design where a small number of modal currents are the major contributors of the radiation field [3], it is less well known how CMs behave at even lower frequencies. Only a few works can be found dealing with low-frequency (LF) CMA in the literature, e.g., Schuman and Harrington [4] studied the LF expansion for CMs of conducting bodies with a perturbation approach. Regarding aperture coupling problems, Leviatan [5] researched on LF CMs for the equivalent magnetic current using generalized admittance operators.-
dc.languageeng-
dc.publisherIEEE. The Journal's web site is located at http://cpmt.ieee.org/transactions-on-cpmt.html-
dc.relation.ispartofIEEE Transactions on Components, Packaging and Manufacturing Technology-
dc.rightsIEEE Transactions on Components, Packaging and Manufacturing Technology. Copyright © IEEE.-
dc.rights©20xx IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. -
dc.subjectAdmittance extraction-
dc.subjectcharacteristic mode analysis (CMA)-
dc.subjecteigenvalue decomposition (EVD)-
dc.subjectlow frequency (LF)-
dc.subjectreduced order modeling-
dc.titleCharacteristic mode and reduced order modeling at low frequencies-
dc.typeArticle-
dc.identifier.emailLiu, Q: qliu0425@hku.hk-
dc.identifier.emailChew, WC: wcchew@hkucc.hku.hk-
dc.identifier.authorityChew, WC=rp00656-
dc.identifier.doi10.1109/TCPMT.2017.2659699-
dc.identifier.scopuseid_2-s2.0-85014258576-
dc.identifier.hkuros280996-
dc.identifier.volume7-
dc.identifier.spage669-
dc.identifier.epage677-
dc.identifier.isiWOS:000401979800003-
dc.publisher.placeUnited States-
dc.identifier.issnl2156-3950-

Export via OAI-PMH Interface in XML Formats


OR


Export to Other Non-XML Formats