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Article: Degradation mechanism of a junction-free transparent silver network electrode

TitleDegradation mechanism of a junction-free transparent silver network electrode
Authors
Issue Date2016
PublisherRoyal Soc Chemistry. The Journal's web site is located at http://pubs.rsc.org/en/journals/journalissues/ra
Citation
RSC Advances, 2016, v. 6 n. 77, p. 73769-73775 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/312743
ISI Accession Number ID
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DC FieldValueLanguage
dc.contributor.authorCHEUK, KW-
dc.contributor.authorPEI, K-
dc.contributor.authorChan, KL-
dc.date.accessioned2022-05-12T10:54:58Z-
dc.date.available2022-05-12T10:54:58Z-
dc.date.issued2016-
dc.identifier.citationRSC Advances, 2016, v. 6 n. 77, p. 73769-73775-
dc.identifier.urihttp://hdl.handle.net/10722/312743-
dc.languageeng-
dc.publisherRoyal Soc Chemistry. The Journal's web site is located at http://pubs.rsc.org/en/journals/journalissues/ra-
dc.relation.ispartofRSC Advances-
dc.titleDegradation mechanism of a junction-free transparent silver network electrode-
dc.typeArticle-
dc.identifier.emailChan, KL: pklc@hku.hk-
dc.identifier.authorityChan, KL=rp01532-
dc.identifier.doi10.1039/C6RA15135C-
dc.identifier.hkuros332964-
dc.identifier.volume6-
dc.identifier.issue77-
dc.identifier.spage73769-
dc.identifier.epage73775-
dc.identifier.isiWOS:000381490100103-
dc.publisher.placeEngland-
dc.relation.projectOrganic memory array fabricated under ambient air environment: from polycrystalline thin film to single crystal devices-

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