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- Publisher Website: 10.1063/1.5002138
- Scopus: eid_2-s2.0-85040737876
- WOS: WOS:000423027300022
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Article: High breakdown electric field in β-Ga2 O3 /graphene vertical barristor heterostructure
Title | High breakdown electric field in β-Ga<inf>2</inf>O<inf>3</inf>/graphene vertical barristor heterostructure |
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Authors | |
Issue Date | 2018 |
Citation | Applied Physics Letters, 2018, v. 112, n. 3, article no. 032101 How to Cite? |
Abstract | In this work, we study the high critical breakdown field in β-Ga2O3 perpendicular to its (100) crystal plane using a β-Ga2O3/graphene vertical heterostructure. Measurements indicate a record breakdown field of 5.2 MV/cm perpendicular to the (100) plane that is significantly larger than the previously reported values on lateral β-Ga2O3 field-effect-transistors (FETs). This result is compared with the critical field typically measured within the (100) crystal plane, and the observed anisotropy is explained through a combined theoretical and experimental analysis. |
Persistent Identifier | http://hdl.handle.net/10722/335300 |
ISSN | 2023 Impact Factor: 3.5 2023 SCImago Journal Rankings: 0.976 |
ISI Accession Number ID |
DC Field | Value | Language |
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dc.contributor.author | Yan, Xiaodong | - |
dc.contributor.author | Esqueda, Ivan S. | - |
dc.contributor.author | Ma, Jiahui | - |
dc.contributor.author | Tice, Jesse | - |
dc.contributor.author | Wang, Han | - |
dc.date.accessioned | 2023-11-17T08:24:44Z | - |
dc.date.available | 2023-11-17T08:24:44Z | - |
dc.date.issued | 2018 | - |
dc.identifier.citation | Applied Physics Letters, 2018, v. 112, n. 3, article no. 032101 | - |
dc.identifier.issn | 0003-6951 | - |
dc.identifier.uri | http://hdl.handle.net/10722/335300 | - |
dc.description.abstract | In this work, we study the high critical breakdown field in β-Ga2O3 perpendicular to its (100) crystal plane using a β-Ga2O3/graphene vertical heterostructure. Measurements indicate a record breakdown field of 5.2 MV/cm perpendicular to the (100) plane that is significantly larger than the previously reported values on lateral β-Ga2O3 field-effect-transistors (FETs). This result is compared with the critical field typically measured within the (100) crystal plane, and the observed anisotropy is explained through a combined theoretical and experimental analysis. | - |
dc.language | eng | - |
dc.relation.ispartof | Applied Physics Letters | - |
dc.title | High breakdown electric field in β-Ga<inf>2</inf>O<inf>3</inf>/graphene vertical barristor heterostructure | - |
dc.type | Article | - |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1063/1.5002138 | - |
dc.identifier.scopus | eid_2-s2.0-85040737876 | - |
dc.identifier.volume | 112 | - |
dc.identifier.issue | 3 | - |
dc.identifier.spage | article no. 032101 | - |
dc.identifier.epage | article no. 032101 | - |
dc.identifier.isi | WOS:000423027300022 | - |