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- Publisher Website: 10.1109/LED.2023.3287887
- Scopus: eid_2-s2.0-85162897941
- WOS: WOS:001042045700008
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Article: 10-kV Ga2 O3 Charge-Balance Schottky Rectifier Operational at 200 °C
Title | 10-kV Ga<inf>2</inf>O<inf>3</inf>Charge-Balance Schottky Rectifier Operational at 200 °C |
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Authors | |
Keywords | gallium oxide high voltage nickel oxide Power electronics RESURF Schottky diode ultra-wide bandgap |
Issue Date | 2023 |
Citation | IEEE Electron Device Letters, 2023, v. 44, n. 8, p. 1268-1271 How to Cite? |
Abstract | This work demonstrates a lateral Ga2O3 Schottky barrier diode (SBD) with a breakdown voltage (BV) over 10 kV, the highest BV reported in Ga2O3 devices to date. The 10 kV SBD shows good thermal stability up to 200°C, which is among the highest operational temperatures reported in multi-kilovolt Ga2O3 devices. The key device design for achieving such high BV is a reduced surface field (RESURF) structure based on the p-type nickel oxide (NiO), which balances the depletion charges in the n-Ga2O3 channel at high voltage. At BV, the charge-balanced Ga2O3 SBD shows an average lateral electric field (E-field) over 4.7 MV/cm at 25 °C and over 3.5 MV/cm at 200°C, both of which exceed the critical E-field of GaN and SiC. The 10 kV SBD shows a specific on-resistance of $0.27~\Omega \cdot $ cm2 and a turn-on voltage of 1 V; at 200°C, the former doubles and the latter reduces to 0.7 V. These results suggest the good potential of Ga2O3 devices for medium- and high-voltage, high-temperature power applications. |
Persistent Identifier | http://hdl.handle.net/10722/335454 |
ISSN | 2023 Impact Factor: 4.1 2023 SCImago Journal Rankings: 1.250 |
ISI Accession Number ID |
DC Field | Value | Language |
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dc.contributor.author | Qin, Yuan | - |
dc.contributor.author | Xiao, Ming | - |
dc.contributor.author | Porter, Matthew | - |
dc.contributor.author | Ma, Yunwei | - |
dc.contributor.author | Spencer, Joseph | - |
dc.contributor.author | Du, Zhonghao | - |
dc.contributor.author | Jacobs, Alan G. | - |
dc.contributor.author | Sasaki, Kohei | - |
dc.contributor.author | Wang, Han | - |
dc.contributor.author | Tadjer, Marko | - |
dc.contributor.author | Zhang, Yuhao | - |
dc.date.accessioned | 2023-11-17T08:26:02Z | - |
dc.date.available | 2023-11-17T08:26:02Z | - |
dc.date.issued | 2023 | - |
dc.identifier.citation | IEEE Electron Device Letters, 2023, v. 44, n. 8, p. 1268-1271 | - |
dc.identifier.issn | 0741-3106 | - |
dc.identifier.uri | http://hdl.handle.net/10722/335454 | - |
dc.description.abstract | This work demonstrates a lateral Ga2O3 Schottky barrier diode (SBD) with a breakdown voltage (BV) over 10 kV, the highest BV reported in Ga2O3 devices to date. The 10 kV SBD shows good thermal stability up to 200°C, which is among the highest operational temperatures reported in multi-kilovolt Ga2O3 devices. The key device design for achieving such high BV is a reduced surface field (RESURF) structure based on the p-type nickel oxide (NiO), which balances the depletion charges in the n-Ga2O3 channel at high voltage. At BV, the charge-balanced Ga2O3 SBD shows an average lateral electric field (E-field) over 4.7 MV/cm at 25 °C and over 3.5 MV/cm at 200°C, both of which exceed the critical E-field of GaN and SiC. The 10 kV SBD shows a specific on-resistance of $0.27~\Omega \cdot $ cm2 and a turn-on voltage of 1 V; at 200°C, the former doubles and the latter reduces to 0.7 V. These results suggest the good potential of Ga2O3 devices for medium- and high-voltage, high-temperature power applications. | - |
dc.language | eng | - |
dc.relation.ispartof | IEEE Electron Device Letters | - |
dc.subject | gallium oxide | - |
dc.subject | high voltage | - |
dc.subject | nickel oxide | - |
dc.subject | Power electronics | - |
dc.subject | RESURF | - |
dc.subject | Schottky diode | - |
dc.subject | ultra-wide bandgap | - |
dc.title | 10-kV Ga<inf>2</inf>O<inf>3</inf>Charge-Balance Schottky Rectifier Operational at 200 °C | - |
dc.type | Article | - |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1109/LED.2023.3287887 | - |
dc.identifier.scopus | eid_2-s2.0-85162897941 | - |
dc.identifier.volume | 44 | - |
dc.identifier.issue | 8 | - |
dc.identifier.spage | 1268 | - |
dc.identifier.epage | 1271 | - |
dc.identifier.eissn | 1558-0563 | - |
dc.identifier.isi | WOS:001042045700008 | - |