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Article: 10-kV Ga2O3Charge-Balance Schottky Rectifier Operational at 200 °C

Title10-kV Ga<inf>2</inf>O<inf>3</inf>Charge-Balance Schottky Rectifier Operational at 200 °C
Authors
Keywordsgallium oxide
high voltage
nickel oxide
Power electronics
RESURF
Schottky diode
ultra-wide bandgap
Issue Date2023
Citation
IEEE Electron Device Letters, 2023, v. 44, n. 8, p. 1268-1271 How to Cite?
AbstractThis work demonstrates a lateral Ga2O3 Schottky barrier diode (SBD) with a breakdown voltage (BV) over 10 kV, the highest BV reported in Ga2O3 devices to date. The 10 kV SBD shows good thermal stability up to 200°C, which is among the highest operational temperatures reported in multi-kilovolt Ga2O3 devices. The key device design for achieving such high BV is a reduced surface field (RESURF) structure based on the p-type nickel oxide (NiO), which balances the depletion charges in the n-Ga2O3 channel at high voltage. At BV, the charge-balanced Ga2O3 SBD shows an average lateral electric field (E-field) over 4.7 MV/cm at 25 °C and over 3.5 MV/cm at 200°C, both of which exceed the critical E-field of GaN and SiC. The 10 kV SBD shows a specific on-resistance of $0.27~\Omega \cdot $ cm2 and a turn-on voltage of 1 V; at 200°C, the former doubles and the latter reduces to 0.7 V. These results suggest the good potential of Ga2O3 devices for medium- and high-voltage, high-temperature power applications.
Persistent Identifierhttp://hdl.handle.net/10722/335454
ISSN
2023 Impact Factor: 4.1
2023 SCImago Journal Rankings: 1.250
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorQin, Yuan-
dc.contributor.authorXiao, Ming-
dc.contributor.authorPorter, Matthew-
dc.contributor.authorMa, Yunwei-
dc.contributor.authorSpencer, Joseph-
dc.contributor.authorDu, Zhonghao-
dc.contributor.authorJacobs, Alan G.-
dc.contributor.authorSasaki, Kohei-
dc.contributor.authorWang, Han-
dc.contributor.authorTadjer, Marko-
dc.contributor.authorZhang, Yuhao-
dc.date.accessioned2023-11-17T08:26:02Z-
dc.date.available2023-11-17T08:26:02Z-
dc.date.issued2023-
dc.identifier.citationIEEE Electron Device Letters, 2023, v. 44, n. 8, p. 1268-1271-
dc.identifier.issn0741-3106-
dc.identifier.urihttp://hdl.handle.net/10722/335454-
dc.description.abstractThis work demonstrates a lateral Ga2O3 Schottky barrier diode (SBD) with a breakdown voltage (BV) over 10 kV, the highest BV reported in Ga2O3 devices to date. The 10 kV SBD shows good thermal stability up to 200°C, which is among the highest operational temperatures reported in multi-kilovolt Ga2O3 devices. The key device design for achieving such high BV is a reduced surface field (RESURF) structure based on the p-type nickel oxide (NiO), which balances the depletion charges in the n-Ga2O3 channel at high voltage. At BV, the charge-balanced Ga2O3 SBD shows an average lateral electric field (E-field) over 4.7 MV/cm at 25 °C and over 3.5 MV/cm at 200°C, both of which exceed the critical E-field of GaN and SiC. The 10 kV SBD shows a specific on-resistance of $0.27~\Omega \cdot $ cm2 and a turn-on voltage of 1 V; at 200°C, the former doubles and the latter reduces to 0.7 V. These results suggest the good potential of Ga2O3 devices for medium- and high-voltage, high-temperature power applications.-
dc.languageeng-
dc.relation.ispartofIEEE Electron Device Letters-
dc.subjectgallium oxide-
dc.subjecthigh voltage-
dc.subjectnickel oxide-
dc.subjectPower electronics-
dc.subjectRESURF-
dc.subjectSchottky diode-
dc.subjectultra-wide bandgap-
dc.title10-kV Ga<inf>2</inf>O<inf>3</inf>Charge-Balance Schottky Rectifier Operational at 200 °C-
dc.typeArticle-
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1109/LED.2023.3287887-
dc.identifier.scopuseid_2-s2.0-85162897941-
dc.identifier.volume44-
dc.identifier.issue8-
dc.identifier.spage1268-
dc.identifier.epage1271-
dc.identifier.eissn1558-0563-
dc.identifier.isiWOS:001042045700008-

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