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Article: Interlayer antiferromagnetic coupling in Tb3Fe5O12/Y3Fe5O12 bilayers

TitleInterlayer antiferromagnetic coupling in Tb3Fe5O12/Y3Fe5O12 bilayers
Authors
Issue Date28-Aug-2023
PublisherAmerican Institute of Physics
Citation
Applied Physics Letters, 2023, v. 123, n. 9, p. 1-6 How to Cite?
Abstract

The interlayer antiferromagnetic (AFM) coupling between thin films plays a significant role in the application of spintronics and magnetic memory devices. Previously, we observed AFM coupling phenomenon at low temperatures in rare-earth iron garnet bilayers epitaxially grown on Y3Al5O12 substrates. Here, we report a detailed study on the impacts of various factors, including temperature, crystallographic orientation, and layer thickness, on the AMF coupling and magnetization reversal behavior of such a bilayer system. A simple energy model qualitatively described the coupling behavior of the two layers during the magnetization reversal process. The interlayer coupling strength was calculated by measuring the minor magnetic hysteresis loops. The current results can serve as a reminder for future research on interlayer AFM coupling phenomena and highlight the potential of manipulating the magnetic properties in rare-earth garnet bilayers for spintronics studies and other applications.


Persistent Identifierhttp://hdl.handle.net/10722/346060
ISSN
2023 Impact Factor: 3.5
2023 SCImago Journal Rankings: 0.976

 

DC FieldValueLanguage
dc.contributor.authorLiang, Jing Ming-
dc.contributor.authorZhao, Xu Wen-
dc.contributor.authorYuan, Xin-
dc.contributor.authorLiu, Yu Kuai-
dc.contributor.authorNg, Sheung Mei-
dc.contributor.authorWong, Hon Fai-
dc.contributor.authorLi, Pei Gen-
dc.contributor.authorZhou, Yan-
dc.contributor.authorZhang, Fu Xiang-
dc.contributor.authorMak, Chee Leung-
dc.contributor.authorLeung, Chi Wah-
dc.date.accessioned2024-09-07T00:30:22Z-
dc.date.available2024-09-07T00:30:22Z-
dc.date.issued2023-08-28-
dc.identifier.citationApplied Physics Letters, 2023, v. 123, n. 9, p. 1-6-
dc.identifier.issn0003-6951-
dc.identifier.urihttp://hdl.handle.net/10722/346060-
dc.description.abstract<p>The interlayer antiferromagnetic (AFM) coupling between thin films plays a significant role in the application of spintronics and magnetic memory devices. Previously, we observed AFM coupling phenomenon at low temperatures in rare-earth iron garnet bilayers epitaxially grown on Y3Al5O12 substrates. Here, we report a detailed study on the impacts of various factors, including temperature, crystallographic orientation, and layer thickness, on the AMF coupling and magnetization reversal behavior of such a bilayer system. A simple energy model qualitatively described the coupling behavior of the two layers during the magnetization reversal process. The interlayer coupling strength was calculated by measuring the minor magnetic hysteresis loops. The current results can serve as a reminder for future research on interlayer AFM coupling phenomena and highlight the potential of manipulating the magnetic properties in rare-earth garnet bilayers for spintronics studies and other applications.</p>-
dc.languageeng-
dc.publisherAmerican Institute of Physics-
dc.relation.ispartofApplied Physics Letters-
dc.titleInterlayer antiferromagnetic coupling in Tb3Fe5O12/Y3Fe5O12 bilayers-
dc.typeArticle-
dc.identifier.doi10.1063/5.0157882-
dc.identifier.scopuseid_2-s2.0-85170821152-
dc.identifier.volume123-
dc.identifier.issue9-
dc.identifier.spage1-
dc.identifier.epage6-
dc.identifier.eissn1077-3118-
dc.identifier.issnl0003-6951-

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