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Article: Silicon Ion Implant Activation in β-(Al0.2Ga0.8)2O3

TitleSilicon Ion Implant Activation in β-(Al<inf>0.2</inf>Ga<inf>0.8</inf>)<inf>2</inf>O<inf>3</inf>
Authors
Keywordsaluminum gallium oxide
dopant activation
doping
Gallium oxide
ion implantation
Issue Date2024
Citation
Journal of Electronic Materials, 2024, v. 53, n. 6, p. 2811-2816 How to Cite?
AbstractAs gallium oxide-based heterojunction devices gain prominence, low-resistance contacts to aluminum gallium oxide material are of increasing importance for high performance and access to modulation doped layers. Here, the activation of ion-implanted silicon donors is investigated as a function of donor density from 5 × 1018 cm−3 to 1 × 1020 cm−3, activation anneal duration from 6 s to 600 s, and activation temperature from 900°C to 1140°C. Importantly, ohmic behavior was achievable across a reasonably wide process window at moderate to high doping concentrations. Specific contact resistance of 1 × 10−3 Ω cm2 and sheet resistance of 2.8 kΩ/□ were achieved for a 60 nm-deep 1 × 1020 cm−3 box implant after activation at 1000°C for 6 s with standard Ti/Au contacts. Under these conditions, an activation efficiency of 7% was observed with Hall mobility of ~32 cm2/Vs. Furthermore, we demonstrate a Schottky diode formed of implanted material with a rectification ratio > 106 and further confirm the Hall carrier density results using capacitance–voltage profiling analysis. Finally, we show the significant impact of anneal duration and the potential for deleterious over-annealing which reduces the active carrier density, mobility, and resultant material conductivity.
Persistent Identifierhttp://hdl.handle.net/10722/352433
ISSN
2023 Impact Factor: 2.2
2023 SCImago Journal Rankings: 0.439

 

DC FieldValueLanguage
dc.contributor.authorJacobs, Alan G.-
dc.contributor.authorSpencer, Joseph A.-
dc.contributor.authorTadjer, Marko J.-
dc.contributor.authorFeigelson, Boris N.-
dc.contributor.authorLamb, Abbey-
dc.contributor.authorLee, Ming Hsun-
dc.contributor.authorPeterson, Rebecca L.-
dc.contributor.authorAlema, Fikadu-
dc.contributor.authorOsinsky, Andrei-
dc.contributor.authorZhang, Yuhao-
dc.contributor.authorHobart, Karl D.-
dc.contributor.authorAnderson, Travis J.-
dc.date.accessioned2024-12-16T03:58:55Z-
dc.date.available2024-12-16T03:58:55Z-
dc.date.issued2024-
dc.identifier.citationJournal of Electronic Materials, 2024, v. 53, n. 6, p. 2811-2816-
dc.identifier.issn0361-5235-
dc.identifier.urihttp://hdl.handle.net/10722/352433-
dc.description.abstractAs gallium oxide-based heterojunction devices gain prominence, low-resistance contacts to aluminum gallium oxide material are of increasing importance for high performance and access to modulation doped layers. Here, the activation of ion-implanted silicon donors is investigated as a function of donor density from 5 × 1018 cm−3 to 1 × 1020 cm−3, activation anneal duration from 6 s to 600 s, and activation temperature from 900°C to 1140°C. Importantly, ohmic behavior was achievable across a reasonably wide process window at moderate to high doping concentrations. Specific contact resistance of 1 × 10−3 Ω cm2 and sheet resistance of 2.8 kΩ/□ were achieved for a 60 nm-deep 1 × 1020 cm−3 box implant after activation at 1000°C for 6 s with standard Ti/Au contacts. Under these conditions, an activation efficiency of 7% was observed with Hall mobility of ~32 cm2/Vs. Furthermore, we demonstrate a Schottky diode formed of implanted material with a rectification ratio > 106 and further confirm the Hall carrier density results using capacitance–voltage profiling analysis. Finally, we show the significant impact of anneal duration and the potential for deleterious over-annealing which reduces the active carrier density, mobility, and resultant material conductivity.-
dc.languageeng-
dc.relation.ispartofJournal of Electronic Materials-
dc.subjectaluminum gallium oxide-
dc.subjectdopant activation-
dc.subjectdoping-
dc.subjectGallium oxide-
dc.subjection implantation-
dc.titleSilicon Ion Implant Activation in β-(Al<inf>0.2</inf>Ga<inf>0.8</inf>)<inf>2</inf>O<inf>3</inf>-
dc.typeArticle-
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1007/s11664-024-11075-z-
dc.identifier.scopuseid_2-s2.0-85191716456-
dc.identifier.volume53-
dc.identifier.issue6-
dc.identifier.spage2811-
dc.identifier.epage2816-
dc.identifier.eissn1543-186X-

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