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Article: Reflection/transmission confocal microscopy characterization of single-crystal diamond microlens arrays

TitleReflection/transmission confocal microscopy characterization of single-crystal diamond microlens arrays
Authors
Gu, EChoi, HWLiu, CGriffin, CGirkin, JMWatson, IMDawson, MDMcConnell, GGurney, AM
KeywordsPhysics engineering
Issue Date2004
PublisherAmerican Institute of Physics. The Journal's web site is located at http://apl.aip.org/
Citation
Applied Physics Letters, 2004, v. 84 n. 15, p. 2754-2756 How to Cite?
DOI: http://dx.doi.org/10.1063/1.1695101
AbstractThe microlens arrays in type-IIa natural single-crystal diamond were fabricated using the method of photoresist reflow and inductively coupled plasma etching. A laser scanning reflection/transmission confocal microscopy technique has been developed to characterize the optical properties of diamond microlens arrays. It was found that the technique enabled the surface profile of the microlenses to be measured simultaneously with optical parameters including focal length and spot size. The results show that the type-IIa single-crystal diamond microlenses will enable applications in photonics and optoelectronics.
Persistent Identifierhttp://hdl.handle.net/10722/42716
ISSN
0003-6951
2021 Impact Factor: 3.971
2020 SCImago Journal Rankings: 1.182
ISI Accession Number ID
WOS:000220728100012
References
References in Scopus

 

DC FieldValueLanguage
dc.contributor.authorGu, Een_HK
dc.contributor.authorChoi, HWen_HK
dc.contributor.authorLiu, Cen_HK
dc.contributor.authorGriffin, Cen_HK
dc.contributor.authorGirkin, JMen_HK
dc.contributor.authorWatson, IMen_HK
dc.contributor.authorDawson, MDen_HK
dc.contributor.authorMcConnell, Gen_HK
dc.contributor.authorGurney, AMen_HK
dc.date.accessioned2007-03-23T04:30:45Z-
dc.date.available2007-03-23T04:30:45Z-
dc.date.issued2004en_HK
dc.identifier.citationApplied Physics Letters, 2004, v. 84 n. 15, p. 2754-2756-
dc.identifier.issn0003-6951en_HK
dc.identifier.urihttp://hdl.handle.net/10722/42716-
dc.description.abstractThe microlens arrays in type-IIa natural single-crystal diamond were fabricated using the method of photoresist reflow and inductively coupled plasma etching. A laser scanning reflection/transmission confocal microscopy technique has been developed to characterize the optical properties of diamond microlens arrays. It was found that the technique enabled the surface profile of the microlenses to be measured simultaneously with optical parameters including focal length and spot size. The results show that the type-IIa single-crystal diamond microlenses will enable applications in photonics and optoelectronics.en_HK
dc.format.extent251930 bytes-
dc.format.extent27136 bytes-
dc.format.mimetypeapplication/pdf-
dc.format.mimetypeapplication/msword-
dc.languageengen_HK
dc.publisherAmerican Institute of Physics. The Journal's web site is located at http://apl.aip.org/en_HK
dc.relation.ispartofApplied Physics Lettersen_HK
dc.rightsCopyright 2004 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters, 2004, v. 84 n. 15, p. 2754-2756 and may be found at https://doi.org/10.1063/1.1695101-
dc.subjectPhysics engineeringen_HK
dc.titleReflection/transmission confocal microscopy characterization of single-crystal diamond microlens arraysen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0003-6951&volume=84&issue=15&spage=2754&epage=2756&date=2004&atitle=Reflection/transmission+confocal+microscopy+characterization+of+single-crystal+diamond+microlens+arraysen_HK
dc.identifier.emailChoi, HW:hwchoi@eee.hku.hken_HK
dc.identifier.authorityChoi, HW=rp00108en_HK
dc.description.naturepublished_or_final_versionen_HK
dc.identifier.doi10.1063/1.1695101en_HK
dc.identifier.scopuseid_2-s2.0-2342473920en_HK
dc.identifier.hkuros109863-
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-2342473920&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume84en_HK
dc.identifier.issue15en_HK
dc.identifier.spage2754en_HK
dc.identifier.epage2756en_HK
dc.identifier.isiWOS:000220728100012-
dc.publisher.placeUnited Statesen_HK
dc.identifier.scopusauthoridGu, E=7004420026en_HK
dc.identifier.scopusauthoridChoi, HW=7404334877en_HK
dc.identifier.scopusauthoridLiu, C=36064477300en_HK
dc.identifier.scopusauthoridGriffin, C=8732304400en_HK
dc.identifier.scopusauthoridGirkin, JM=6701651108en_HK
dc.identifier.scopusauthoridWatson, IM=24482692400en_HK
dc.identifier.scopusauthoridDawson, MD=7203061779en_HK
dc.identifier.scopusauthoridMcConnell, G=7004466744en_HK
dc.identifier.scopusauthoridGurney, AM=7004912024en_HK
dc.identifier.issnl0003-6951-

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