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Article: Accurate determination of mode I and II leading coefficients of the Williams expansion by finite element analysis
Title | Accurate determination of mode I and II leading coefficients of the Williams expansion by finite element analysis |
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Authors | |
Keywords | Fractal finite element Higher-degree coefficients Stress intensity factor T-stress Williams expansion |
Issue Date | 2005 |
Publisher | Elsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/finel |
Citation | Finite Elements In Analysis And Design, 2005, v. 41 n. 11-12, p. 1175-1186 How to Cite? |
Abstract | Leading coefficients of the Williams expansion are evaluated by using the fractal finite-element method (FFEM). By means of the self-similarity principle, an infinite number of elements is generated at the vicinity of the crack tip to model the crack tip singularity. The Williams expansion series with higher-degree coefficients is used to capture the singular and non-singular stress behaviour around the crack tip and to condense the large amount of nodal displacements at the crack tip to a small set of unknown coefficients. New sets of coefficients up to the sixth degree for mode I and fourth degree for mode II problems are solved. The important fracture parameters such as stress intensity factors and T-stress can be obtained directly from the coefficients without employing any path independent integrals. Convergence study reveals that the present method is simple and very coarse finite element meshes with 12 leading terms in the William expansion can yield very accurate solutions. The effects of the influence of crack length on the higher-degree coefficients of some common plane crack problems are studied in detail. © 2005 Elsevier B.V. All rights reserved. |
Persistent Identifier | http://hdl.handle.net/10722/48545 |
ISSN | 2023 Impact Factor: 3.5 2023 SCImago Journal Rankings: 0.835 |
ISI Accession Number ID | |
References | |
Grants |
DC Field | Value | Language |
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dc.contributor.author | Su, RKL | en_HK |
dc.contributor.author | Feng, WJ | en_HK |
dc.date.accessioned | 2008-05-22T04:16:45Z | - |
dc.date.available | 2008-05-22T04:16:45Z | - |
dc.date.issued | 2005 | en_HK |
dc.identifier.citation | Finite Elements In Analysis And Design, 2005, v. 41 n. 11-12, p. 1175-1186 | en_HK |
dc.identifier.issn | 0168-874X | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/48545 | - |
dc.description.abstract | Leading coefficients of the Williams expansion are evaluated by using the fractal finite-element method (FFEM). By means of the self-similarity principle, an infinite number of elements is generated at the vicinity of the crack tip to model the crack tip singularity. The Williams expansion series with higher-degree coefficients is used to capture the singular and non-singular stress behaviour around the crack tip and to condense the large amount of nodal displacements at the crack tip to a small set of unknown coefficients. New sets of coefficients up to the sixth degree for mode I and fourth degree for mode II problems are solved. The important fracture parameters such as stress intensity factors and T-stress can be obtained directly from the coefficients without employing any path independent integrals. Convergence study reveals that the present method is simple and very coarse finite element meshes with 12 leading terms in the William expansion can yield very accurate solutions. The effects of the influence of crack length on the higher-degree coefficients of some common plane crack problems are studied in detail. © 2005 Elsevier B.V. All rights reserved. | en_HK |
dc.format.extent | 226149 bytes | - |
dc.format.extent | 40905 bytes | - |
dc.format.mimetype | application/pdf | - |
dc.format.mimetype | application/pdf | - |
dc.language | eng | en_HK |
dc.publisher | Elsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/finel | en_HK |
dc.relation.ispartof | Finite Elements in Analysis and Design | en_HK |
dc.rights | Finite Elements in Analysis and Design. Copyright © Elsevier BV. | en_HK |
dc.rights | This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License. | - |
dc.subject | Fractal finite element | en_HK |
dc.subject | Higher-degree coefficients | en_HK |
dc.subject | Stress intensity factor | en_HK |
dc.subject | T-stress | en_HK |
dc.subject | Williams expansion | en_HK |
dc.title | Accurate determination of mode I and II leading coefficients of the Williams expansion by finite element analysis | en_HK |
dc.type | Article | en_HK |
dc.identifier.openurl | http://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0168-874X&volume=41&issue=11-12&spage=1175&epage=1186&date=2005&atitle=Accurate+determination+of+mode+I+and+mode+II+leading+coefficients+of+the+williams+expansion+by+finite+element+analysis | en_HK |
dc.identifier.email | Su, RKL:klsu@hkucc.hku.hk | en_HK |
dc.identifier.authority | Su, RKL=rp00072 | en_HK |
dc.description.nature | postprint | en_HK |
dc.identifier.doi | 10.1016/j.finel.2004.11.006 | en_HK |
dc.identifier.scopus | eid_2-s2.0-18844416619 | en_HK |
dc.identifier.hkuros | 98336 | - |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-18844416619&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.volume | 41 | en_HK |
dc.identifier.issue | 11-12 | en_HK |
dc.identifier.spage | 1175 | en_HK |
dc.identifier.epage | 1186 | en_HK |
dc.identifier.isi | WOS:000229705400010 | - |
dc.publisher.place | Netherlands | en_HK |
dc.relation.project | Interaction of multiple branched cracks | - |
dc.identifier.scopusauthorid | Su, RKL=7102627096 | en_HK |
dc.identifier.scopusauthorid | Feng, WJ=12752270200 | en_HK |
dc.identifier.issnl | 0168-874X | - |