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Article: Modifications of the exciton lifetime and internal quantum efficiency for organic light-emitting devices with a weak/strong microcavity

TitleModifications of the exciton lifetime and internal quantum efficiency for organic light-emitting devices with a weak/strong microcavity
Authors
Chen, XWChoy, WCHLiang, CJWai, PKAHe, S
KeywordsPhysics engineering
Issue Date2007
PublisherAmerican Institute of Physics. The Journal's web site is located at http://apl.aip.org/
Citation
Applied Physics Letters, 2007, v. 91 n. 22, article no. 221112 How to Cite?
DOI: http://dx.doi.org/10.1063/1.2819610
AbstractA comprehensive analysis is given on the modifications of the exciton lifetime and internal quantum efficiency (int) for organic light-emitting devices (OLEDs). A linear relation is derived between the exciton lifetime and int, which is difficult to measure directly. The internal quantum efficiency can thus be estimated easily through the measurement of the exciton lifetime. The exciton lifetimes for OLEDs with weak or strong microcavity are studied experimentally and theoretically. The modification of the exciton lifetime is well explained through the microcavity effect and surface plasmon resonance. An excellent agreement between the experimental and theoretical results is achieved. © 2007 American Institute of Physics.
Persistent Identifierhttp://hdl.handle.net/10722/57433
ISSN
0003-6951
2023 Impact Factor: 3.5
2023 SCImago Journal Rankings: 0.976
ISI Accession Number ID
WOS:000251324600012
References
References in Scopus

 

DC FieldValueLanguage
dc.contributor.authorChen, XWen_HK
dc.contributor.authorChoy, WCHen_HK
dc.contributor.authorLiang, CJen_HK
dc.contributor.authorWai, PKAen_HK
dc.contributor.authorHe, Sen_HK
dc.date.accessioned2010-04-12T01:36:45Z-
dc.date.available2010-04-12T01:36:45Z-
dc.date.issued2007en_HK
dc.identifier.citationApplied Physics Letters, 2007, v. 91 n. 22, article no. 221112-
dc.identifier.issn0003-6951en_HK
dc.identifier.urihttp://hdl.handle.net/10722/57433-
dc.description.abstractA comprehensive analysis is given on the modifications of the exciton lifetime and internal quantum efficiency (int) for organic light-emitting devices (OLEDs). A linear relation is derived between the exciton lifetime and int, which is difficult to measure directly. The internal quantum efficiency can thus be estimated easily through the measurement of the exciton lifetime. The exciton lifetimes for OLEDs with weak or strong microcavity are studied experimentally and theoretically. The modification of the exciton lifetime is well explained through the microcavity effect and surface plasmon resonance. An excellent agreement between the experimental and theoretical results is achieved. © 2007 American Institute of Physics.en_HK
dc.languageengen_HK
dc.publisherAmerican Institute of Physics. The Journal's web site is located at http://apl.aip.org/en_HK
dc.relation.ispartofApplied Physics Lettersen_HK
dc.rightsCopyright 2007 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters, 2007, v. 91 n. 22, article no. 221112 and may be found at https://doi.org/10.1063/1.2819610-
dc.subjectPhysics engineeringen_HK
dc.titleModifications of the exciton lifetime and internal quantum efficiency for organic light-emitting devices with a weak/strong microcavityen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0003-6951&volume=91&issue=22&spage=221112&epage=1 &date=2007&atitle=Modifications+of+the+exciton+lifetime+and+internal+quantum+efficiency+for+organic+light-emitting+devices+with+a+weak/strong+microcavityen_HK
dc.identifier.emailChoy, WCH:chchoy@eee.hku.hken_HK
dc.identifier.authorityChoy, WCH=rp00218en_HK
dc.description.naturepublished_or_final_versionen_HK
dc.identifier.doi10.1063/1.2819610en_HK
dc.identifier.scopuseid_2-s2.0-36549069146en_HK
dc.identifier.hkuros147722-
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-36549069146&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume91en_HK
dc.identifier.issue22en_HK
dc.identifier.spagearticle no. 221112-
dc.identifier.epagearticle no. 221112-
dc.identifier.isiWOS:000251324600012-
dc.publisher.placeUnited Statesen_HK
dc.identifier.scopusauthoridChen, XW=9637396600en_HK
dc.identifier.scopusauthoridChoy, WCH=7006202371en_HK
dc.identifier.scopusauthoridLiang, CJ=54786617200en_HK
dc.identifier.scopusauthoridWai, PKA=35249484600en_HK
dc.identifier.scopusauthoridHe, S=36048024500en_HK
dc.identifier.issnl0003-6951-

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