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Article: Regularity analysis for patterned texture inspection

TitleRegularity analysis for patterned texture inspection
Authors
KeywordsFabric inspection
Patterned texture analysis
Periodicity
Regular bands
Regularity analysis
Issue Date2009
PublisherIEEE.
Citation
Ieee Transactions On Automation Science And Engineering, 2009, v. 6 n. 1, p. 131-144 How to Cite?
AbstractThis paper considers regularity analysis for patterned texture material inspection. Patterned texture-like fabric is built on a repetitive unit of a pattern. Regularity is one of the most important features in many textures. In this paper, a new patterned texture inspection approach called the regular bands (RB) method is described. First, the properties of textures and the meaning of regularity measurements are presented. Next, traditional regularity analysis for patterned textures is introduced. Many traditional approaches such as co-occurrence matrices, autocorrelation, traditional image subtraction and hash function are based on the concept of periodicity. These approaches have been applied for image retrieval, image synthesis, and defect detection of patterned textures. In this paper, a new measure of periodicity for patterned textures is described. The Regular Bands method is based on the idea of periodicity. A detailed description of the RB method with definitions, procedures, and explanations is given. There is also a detailed evaluation using the Regular Bands of some patterned textures. Three kinds of patterned fabric samples are used in the evaluation and a high detection success rate is achieved. Finally, there is a discussion of the method and some conclusions. © 2006 IEEE.
Persistent Identifierhttp://hdl.handle.net/10722/58843
ISSN
2023 Impact Factor: 5.9
2023 SCImago Journal Rankings: 2.144
ISI Accession Number ID
Funding AgencyGrant Number
University of Hong KongHKU 7169/03E
CRCG 10205131
Funding Information:

Manuscript received April 30. 2007; revised August 15, 2007. First published December 30, 2008; current version published December 30, 2008. This paper was recommended for publication by Associate Editor H. Qiao and Editor M. Wang upon evaluation of the reviewers' comments. This work was supported by Grants HKU 7169/03E and CRCG 10205131 from the University of Hong Kong.

References
Grants

 

DC FieldValueLanguage
dc.contributor.authorNgan, HYTen_HK
dc.contributor.authorPang, GKHen_HK
dc.date.accessioned2010-05-31T03:37:53Z-
dc.date.available2010-05-31T03:37:53Z-
dc.date.issued2009en_HK
dc.identifier.citationIeee Transactions On Automation Science And Engineering, 2009, v. 6 n. 1, p. 131-144en_HK
dc.identifier.issn1545-5955en_HK
dc.identifier.urihttp://hdl.handle.net/10722/58843-
dc.description.abstractThis paper considers regularity analysis for patterned texture material inspection. Patterned texture-like fabric is built on a repetitive unit of a pattern. Regularity is one of the most important features in many textures. In this paper, a new patterned texture inspection approach called the regular bands (RB) method is described. First, the properties of textures and the meaning of regularity measurements are presented. Next, traditional regularity analysis for patterned textures is introduced. Many traditional approaches such as co-occurrence matrices, autocorrelation, traditional image subtraction and hash function are based on the concept of periodicity. These approaches have been applied for image retrieval, image synthesis, and defect detection of patterned textures. In this paper, a new measure of periodicity for patterned textures is described. The Regular Bands method is based on the idea of periodicity. A detailed description of the RB method with definitions, procedures, and explanations is given. There is also a detailed evaluation using the Regular Bands of some patterned textures. Three kinds of patterned fabric samples are used in the evaluation and a high detection success rate is achieved. Finally, there is a discussion of the method and some conclusions. © 2006 IEEE.en_HK
dc.languageengen_HK
dc.publisherIEEE.en_HK
dc.relation.ispartofIEEE Transactions on Automation Science and Engineeringen_HK
dc.rights©2008 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.-
dc.subjectFabric inspectionen_HK
dc.subjectPatterned texture analysisen_HK
dc.subjectPeriodicityen_HK
dc.subjectRegular bandsen_HK
dc.subjectRegularity analysisen_HK
dc.titleRegularity analysis for patterned texture inspectionen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=1545-5955&volume=6&issue=1&spage=131&epage=144&date=2009&atitle=Regularity+analysis+for+patterned+texture+inspectionen_HK
dc.identifier.emailPang, GKH:gpang@eee.hku.hken_HK
dc.identifier.authorityPang, GKH=rp00162en_HK
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1109/TASE.2008.917140en_HK
dc.identifier.scopuseid_2-s2.0-58149515956en_HK
dc.identifier.hkuros172004en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-58149515956&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume6en_HK
dc.identifier.issue1en_HK
dc.identifier.spage131en_HK
dc.identifier.epage144en_HK
dc.identifier.isiWOS:000262327200014-
dc.publisher.placeUnited Statesen_HK
dc.relation.projectWavelet transform approach for defect classification in textured materials-
dc.identifier.scopusauthoridNgan, HYT=7102173824en_HK
dc.identifier.scopusauthoridPang, GKH=7103393283en_HK
dc.identifier.issnl1545-5955-

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