Showing results 1 to 1 of 1
Title | Author(s) | Issue Date | |
---|---|---|---|
Effects of trapped charges in gate dielectric and high- k encapsulation on performance of MoS2 transistor Journal:IEEE Transactions on Electron Devices | 2019 |
Title | Author(s) | Issue Date | |
---|---|---|---|
Effects of trapped charges in gate dielectric and high- k encapsulation on performance of MoS2 transistor Journal:IEEE Transactions on Electron Devices | 2019 |