Showing results 4 to 6 of 6
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Title | Author(s) | Issue Date | |
---|---|---|---|
Reliability of Ultrathin High-κ Dielectrics on Chemical-vapor Deposited 2D Semiconductors Proceeding/Conference:International Electron Devices Meeting (IEDM) | 2020 | ||
Switchable NAND and NOR Logic Computing in Single Triple-Gate Monolayer MoS2 n-FET Proceeding/Conference:International Electron Devices Meeting (IEDM) | 2020 | ||
2019 |