Browsing by Author Chen, TP

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TitleAuthor(s)Issue DateViews
 
1995
136
 
Characterization of optical and structural properties of Pt-Si interface by spectroscopic ellipsometry
Proceeding/Conference:Proceedings of the 22nd International Conference on the Physics of Semiconductors, Canada
1994
87
 
1994
178
 
2010
105
 
2007
136
 
2008
78
 
2006
178
 
2004
175
 
2006
165
 
2009
199
 
2009
178
 
2011
125
 
2012
46
 
2004
183
 
1993
154
 
2006
180
 
2003
170
 
2003
61
 
1994
95
 
2006
158