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Title	Author(s)	Issue Date
A calculation of the photovoltage at the metal-semiconductor interface Journal:Surface Science	Ling, CC Chen, TP Fung, S	1993
Capacitance switching in SiO 2 thin film embedded with Ge nanocrystals caused by ultraviolet illumination Journal:Applied Physics Letters	Yang, M Chen, TP Ding, L Liu, Y Zhu, FR Fung, S	2009
Cathodoluminescence from interband transitions in germanium (111) and gallium arsenide (100) crystals Journal:Physical Review B (Condensed Matter)	Xu, XL Hao, LY Xu, KZ Chen, TP Fung, S	1995
Characterization of optical and structural properties of Pt-Si interface by spectroscopic ellipsometry Proceeding/Conference:Proceedings of the 22nd International Conference on the Physics of Semiconductors, Canada	Liu, YC Chen, TP Reddy, CV Fung, S Beling, CD	1994
Characterization of Pt-Si interface by spectroscopic ellipsometry Journal:Journal of Applied Physics	Liu, YC Chen, TP Fung, S Beling, CD	1994
Charge storage behaviors of ge nanocrystals embedded in SiO 2 for the application in non-volatile memory devices Journal:Journal of Nanoscience and Nanotechnology	Yang, M Chen, TP Wong, JI Liu, Y Tseng, AA Fung, S	2010
Charge trapping and retention behaviors of Ge nanocrystals distributed in the gate oxide near the gate synthesized by low-energy ion implantation Journal:Journal of Applied Physics	Yang, M Chen, TP Wong, JI Ng, CY Liu, Y Ding, L Fung, S Trigg, AD Tung, CH Li, CM	2007
Charging effect of Al 2O 3 thin films containing Al nanocrystals Journal:Applied Physics Letters	Liu, Y Chen, TP Zhu, W Yang, M Cen, ZH Wong, JI Li, YB Zhang, S Chen, XB Fung, S	2008
Charging effect on current conduction in aluminum nitride thin films containing Al nanocrystals Journal:Applied Physics Letters	Liu, Y Chen, TP Lau, HW Wong, JI Ding, L Zhang, S Fung, S	2006
Charging effect on electrical characteristics of MOS structures with Si nanocrystal distribution in gate oxide Journal:Electrochemical and Solid-State Letters	Liu, Y Chen, TP Ng, CY Tse, MS Fung, S Liu, YC Li, S Zhao, P	2004
Charging mechanism in a SiO 2 matrix embedded with Si nanocrystals Journal:Journal of Applied Physics	Liu, Y Chen, TP Ding, L Zhang, S Fu, YQ Fung, S	2006
Charging-induced changes in reverse current-voltage characteristics of Al/Al-Rich Al 2O 3/p-Si Diodes Journal:IEEE Transactions on Electron Devices	Zhu, W Chen, TP Liu, Y Yang, M Zhang, S Zhang, WL Fung, S	2009
CMOS-compatible light-emitting devices based on thin aluminum nitride film containing Al nanocrystals Journal:Applied Physics A: Materials Science and Processing	Liu, Y Chen, TP Yang, M Cen, ZH Chen, XB Li, YB Fung, S	2009
Competition of resistive-switching mechanisms in nickel-rich nickel oxide thin films Journal:Electrochemical and Solid-State Letters	Yu, Q Liu, Y Chen, TP Liu, Z Yu, YF Fung, S	2011
Conduction mechanisms at low- and high-resistance states in aluminum/anodic aluminum oxide/aluminum thin film structure Journal:Journal of Applied Physics	Zhu, W Chen, TP Liu, Y Fung, SHY	2012
Core-level shift of Si nanocrystals embedded in a SiO 2 matrix Journal:Journal of Physical Chemistry B	Chen, TP Liu, Y Sun, CQ Tse, MS Hsieh, JH Fu, YQ Liu, YC Fung, S	2004
Current transport and its effect on the determination of the Schottky-barrier height in a typical system: Gold on silicon Journal:Solid-State Electronics	Chen, TP Lee, TC Ling, CC Beling, CD Fung, S	1993
Depth profiling of charging effect of Si nanocrystals embedded in SiO2: A study of charge diffusion among Si nanocrystals Journal:Journal of Physical Chemistry B	Liu, Y Chen, TP Ng, CY Ding, L Zhang, S Fu, YQ Fung, S	2006
Depth profiling of Si nanocrystals in Si-implanted SiO2 films by spectroscopic ellipsometry Journal:Applied Physics Letters	Chen, TP Liu, Y Tse, MS Ho, PF Dong, G Fung, S	2003
Depth Profiling of Si Oxidation States in Si-Implanted SiO 2 Films by X-Ray Photoelectron Spectroscopy Journal:Japanese Journal of Applied Physics, Part 2: Letters	Liu, Y Fu, YQ Chen, TP Tse, MS Fung, S Hsieh, JH Yang, XH	2003

Showing results 4 to 23 of 87 < previous next >