Showing results 1 to 3 of 3
| Title | Author(s) | Issue Date | |
|---|---|---|---|
Effects of Coulomb and Roughness Scatterings on 4H-SiC MOSFET Proceeding/Conference:IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) | 2019 | ||
Simulation Study of 4H-SiC High-k Pillar MOSFET With Integrated Schottky Barrier Diode Journal:IEEE Journal of the Electron Devices Society | 2021 | ||
| 1-Apr-2023 |