Browsing by Author Li, Qiang

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TitleAuthor(s)Issue Date
A Converter Based Switching Loss Measurement Method for WBG Device
Proceeding/Conference:Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
2023
 
2008
A Simple and Accurate Method to Characterize Output Capacitance Losses of GaN HEMTs
Proceeding/Conference:2022 IEEE Energy Conversion Congress and Exposition, ECCE 2022
2022
Accelerating the Recovery of p-Gate GaN HEMTs after Overvoltage Stresses
Proceeding/Conference:IEEE International Reliability Physics Symposium Proceedings
2022
2022
 
2022
 
2023
 
3-Apr-2023
 
2023
 
Evaluation and MHz Converter Application of 1.2-kV Vertical GaN JFET
Journal:IEEE Transactions on Power Electronics
2024
Failure Mechanisms of Cascode GaN HEMTs under Overvoltage and Surge Energy Events
Proceeding/Conference:IEEE International Reliability Physics Symposium Proceedings
2021
 
1-Oct-2024
GaN HEMTs in High-Frequency Overvoltage Switching: Electrical or Thermal Failure?
Proceeding/Conference:Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
2023
Gate Lifetime of P-Gate GaN HEMT in Inductive Power Switching
Proceeding/Conference:Proceedings of the International Symposium on Power Semiconductor Devices and ICs
2023
Gate Lifetime of P-Gate GaN HEMT under DC and Switching Overvoltage Stress
Proceeding/Conference:2023 IEEE 10th Workshop on Wide Bandgap Power Devices and Applications, WiPDA 2023
2023
 
2024
Impact of Conduction Current on Output Capacitance Loss in GaN HEMTs
Proceeding/Conference:Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
2023
 
2015
Investigation on Physical Origins of Output Capacitance Loss in Cascode GaN HEMTs
Proceeding/Conference:Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
2023
 
Minimizing Output Capacitance Loss in GaN Power HEMT
Journal:IEEE Transactions on Power Electronics
2024