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Title	Author(s)	Issue Date
A Converter Based Switching Loss Measurement Method for WBG Device Proceeding/Conference:Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC	Yang, Qiuzhe Nabih, Ahmed Zhang, Ruizhe Li, Qiang Zhang, Yuhao	2023
A La-Related Protein Modulates 7SK snRNP Integrity to Suppress P-TEFb-Dependent Transcriptional Elongation and Tumorigenesis Journal:Molecular Cell	He, Nanhai Jahchan, Nadine S.Hong, Eunmee Li, Qiang Bayfield, Mark A.Maraia, Richard J.Luo, Kunxin Zhou, Qiang	2008
A Simple and Accurate Method to Characterize Output Capacitance Losses of GaN HEMTs Proceeding/Conference:2022 IEEE Energy Conversion Congress and Exposition, ECCE 2022	Song, Qihao Zhang, Ruizhe Li, Qiang Zhang, Yuhao	2022
Accelerating the Recovery of p-Gate GaN HEMTs after Overvoltage Stresses Proceeding/Conference:IEEE International Reliability Physics Symposium Proceedings	Kozak, Joseph P.Song, Qihao Liu, Jingcun Zhang, Ruizhe Li, Qiang Saito, Wataru Zhang, Yuhao	2022
Breakthrough Avalanche and Short Circuit Robustness in Vertical GaN Power Devices Proceeding/Conference:ECS Transactions	Zhang, Yuhao Zhang, Ruizhe Song, Qihao Li, Qiang Liu, J.	2022
Breakthrough Short Circuit Robustness Demonstrated in Vertical GaN Fin JFET Journal:IEEE Transactions on Power Electronics	Zhang, Ruizhe Liu, Jingcun Li, Qiang Pidaparthi, Subhash Edwards, Andrew Drowley, Cliff Zhang, Yuhao	2022
Degradation and Recovery of GaN HEMTs in Overvoltage Hard Switching Near Breakdown Voltage Journal:IEEE Transactions on Power Electronics	Kozak, Joseph P.Song, Qihao Zhang, Ruizhe Ma, Yunwei Liu, Jingcun Li, Qiang Saito, Wataru Zhang, Yuhao	2023
Disamenities of living close to transit tracks: Evidence from Singapore's MRT system Journal:Regional Science and Urban Economics	Diao, Mi Li, Qiang Sing, Tien Foo Zhan, Changwei	3-Apr-2023
Dynamic Gate Breakdown of p-Gate GaN HEMTs in Inductive Power Switching Journal:IEEE Electron Device Letters	Wang, Bixuan Zhang, Ruizhe Wang, Hengyu He, Quanbo Song, Qihao Li, Qiang Udrea, Florin Zhang, Yuhao	2023
Evaluation and MHz Converter Application of 1.2-kV Vertical GaN JFET Journal:IEEE Transactions on Power Electronics	Yang, Xin Zhang, Ruizhe Yang, Qiuzhe Song, Qihao Litchford, Everest Walker, Andy J.Pidaparthi, Subhash Drowley, Cliff Dong, Dong Li, Qiang Zhang, Yuhao	2024
Failure Mechanisms of Cascode GaN HEMTs under Overvoltage and Surge Energy Events Proceeding/Conference:IEEE International Reliability Physics Symposium Proceedings	Song, Qihao Zhang, Ruizhe Kozak, Joseph P.Liu, Jingcun Li, Qiang Zhang, Yuhao	2021
Frontiers in high entropy alloys and high entropy functional materials Journal:Rare Metals	Zhang, Wen Tao Wang, Xue Qian Zhang, Feng Qi Cui, Xiao Ya Fan, Bing Bing Guo, Jia Ming Guo, Zhi Min Huang, Rui Huang, Wen Li, Xu Bo Li, Meng Ru Ma, Yan Shen, Zhi Hua Sun, Yong Gang Wang, De Zhuang Wang, Fei Yang Wang, Li Qiang Wang, Nan Wang, Tian Li Wang, Wei Wang, Xiao Yang Wang, Yi Han Yu, Fu Jie Yin, Yu Zhen Zhang, Ling Kun Zhang, Yi Zhang, Jian Yang Zhao, Qi Zhao, Yu Ping Zhu, Xin Dong Sohail, Yasir Chen, Ya Nan Feng, Tao Gao, Qi Long He, Hai Yan Huang, Yong Jiang Jiao, Zeng Bao Ji, Hua Jiang, Yao Li, Qiang Li, Xiao Ming Liao, Wei Bing Lin, Huai Jun Liu, Hui Liu, Qi Liu, Qing Feng Liu, Wei Di Liu, Xiong Jun Lu, Yang Lu, Yi Ping Ma, Wen Miao, Xue Fei Pan, Jie Wang, Qing Wu, Hong Hui Wu, Yuan Yang, Tao Yang, Wei Ming Yu, Qian Zhang, Jin Yu Chen, Zhi Gang Mao, Liang Ren, Yang Shen, Bao Long Wang, Xun Li Jia, Zhe Zhu, He Wu, Zhen Duo Lan, Si	1-Oct-2024
GaN HEMTs in High-Frequency Overvoltage Switching: Electrical or Thermal Failure? Proceeding/Conference:Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC	Zhang, Ruizhe Song, Qihao Li, Qiang Zhang, Yuhao	2023
Gate Lifetime of P-Gate GaN HEMT in Inductive Power Switching Proceeding/Conference:Proceedings of the International Symposium on Power Semiconductor Devices and ICs	Wang, Bixuan Zhang, Ruizhe Wang, Hengyu He, Quanbo Song, Qihao Li, Qiang Udrea, Florin Zhang, Yuhao	2023
Gate Lifetime of P-Gate GaN HEMT under DC and Switching Overvoltage Stress Proceeding/Conference:2023 IEEE 10th Workshop on Wide Bandgap Power Devices and Applications, WiPDA 2023	Wang, Bixuan Zhang, Ruizhe Song, Qihao Li, Qiang Zhang, Yuhao	2023
Gate Robustness and Reliability of P-Gate GaN HEMT Evaluated by a Circuit Method Journal:IEEE Transactions on Power Electronics	Wang, Bixuan Zhang, Ruizhe Song, Qihao Wang, Hengyu He, Quanbo Li, Qiang Udrea, Florin Zhang, Yuhao	2024
Impact of Conduction Current on Output Capacitance Loss in GaN HEMTs Proceeding/Conference:Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC	Song, Qihao Zhang, Ruizhe Li, Qiang Zhang, Yuhao	2023
Integrating commodity futures in procurement planning and contract design with demand forecast update	Li, Qiang 李強	2015
Investigation on Physical Origins of Output Capacitance Loss in Cascode GaN HEMTs Proceeding/Conference:Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC	Song, Qihao Zhang, Ruizhe Li, Qiang Zhang, Yuhao	2023
Minimizing Output Capacitance Loss in GaN Power HEMT Journal:IEEE Transactions on Power Electronics	Song, Qihao Briga, Adam Veprinsky, Valery Volkov, Roman Li, Qiang Zhang, Yuhao	2024

Showing results 1 to 20 of 36 next >