Browsing by Author Li, Qiang

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TitleAuthor(s)Issue Date
A Converter Based Switching Loss Measurement Method for WBG Device
Proceeding/Conference:Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
2023
 
2008
A Simple and Accurate Method to Characterize Output Capacitance Losses of GaN HEMTs
Proceeding/Conference:2022 IEEE Energy Conversion Congress and Exposition, ECCE 2022
2022
Accelerating the Recovery of p-Gate GaN HEMTs after Overvoltage Stresses
Proceeding/Conference:IEEE International Reliability Physics Symposium Proceedings
2022
 
Qin, ShukuiChen, MinshanCheng, Ann-LiiKaseb, Ahmed OKudo, MasatoshiLee, Han ChuYopp, Adam CZhou, JianWang, LuWen, XiaoyuHeo, JeongTak, Won YoungNakamura, ShinichiroNumata, KazushiUguen, ThomasHsiehchen, DavidCha, EdwardHack, Stephen PLian, QinshuMa, NingSpahn, Jessica HWang, YuleiWu, ChunChow, Pierce K HThompson, AlexanderDanta, MarkPoursoltan, PiroozKiberu, AndrewChittajallu, RenukaSood, SiddarthStauber, RudolfPinter, MatthiasPeck-Radosavljevic, MarkusDecaestecker, JochenCuyle, Pieter-JanVerset, GontranVan Vlierberghe, HansDe Azevedo, SergioAndrade, LiviaCunha Júnior, AdemarFaria, LuizaYen, Cheng TzuColli, LeandroAsselah, JamilKavan, PetrMarquez, VladimirBrahmania, MayurLi, QiangXing, BaocaiGuo, YabingChen, ZhendongZhao, HaitaoPeng, TaoWang, LimingWang, LuLiu, HongmingWu, FeixiangQin, LunxiuZheng, QichangYing, JieerLi, HaitaoWen, TianfuQin, ShukuiWen, XiaoyuLiu, YunpengChen, MinshanWang, BoqingBai, YuxianHe, YifuZhao, HongZhou, DongDai, ChaoliuTeng, GaojunCui, ShuzhongGao, YiZhang, XizhiLu, ZhengYin, TaoDing, YoumingJia, WeidongXia, YongxiangSun, BeichengXia, QiangYuan, YufengSun, HuichuanShi, XuetaoGuzmán, AdriánCorrales, LuisKral, ZdenekPriester, PeterKubala, EugenBlanc, Jean FredericBourliere, MarcPeron, Jean MarieBorg, ChristopheBronowicki, Jean-PierreGanne, NathalieDecaens, ThomasUguen, ThomasHeurgue, AlexandraTrojan, JoergGonzalez-Carmona, Maria AngelesRoderburg, ChristophEttrich, ThomasSchotten, ClemensKandulski, ArneYau, ThomasChan, LamScartozzi, MarioMasi, GianlucaFanello, SilviaBattezzati, Pier MariaLeonardi, FrancescoGhidini, MicheleNumata, KazushiMorimoto, ManabuHidaka, HisashiTsuchiya, KaoruYamashita, TatsuyaKato, NaoyaKudo, MasatoshiHagihara, AtsushiKoga, HironoriArakawa, TomohiroNakamura, IkuoKawamura, YusukeKawaoka, TomokazuShimada, MitsuoHasegawa, KiyoshiMarusawa, HiroyukiNakamura, ShinchiroHiraoka, AtsushiHayashi, HiromitsuTakeda, ShinLee, Han ChuPaik, Seung WoonKim, Do YoungLee, Jung IlJeong, Sook-HyangKim, WonTak, Won YoungHeo, JeongKim, HyeyeongChon, Hong JaeCheong, JaeyounYoon, Seung KewYoon, Jung-HwanVillalobos, RicardoMartinez Rodriguez, Jorge LuisOyervides Juarez, VictorHernández, Carlos AlbertoKlumpen, Heinz-Josefde Vos-Geelen, JudithGane, EdwardMontenegro, PaolaTorres, Mattos, CesarJanczewska, EwaKawecki, MaciejNowakowska-Zajdel, EwaFedenko, AlexanderGranov, DmitriiAlyasova, AnnaSekacheva, MarinaLedin, EvgenySamol, JensToh, Han ChongCalvo, Campos, MarionaGomez, Martin, CarlosLopez, Lopez, CarlosMuñoz, Martin, Andres JesusCalleja, Panero, Jose LuisMontero, Alvarez, Jose LuisReig, Monzón, MariaDelgado, Mingorance, IgnacioMinguez, Rosique, BeatrizCheng, Ann LiiHuang, Yi-HsiangLin, Shi-MingHuang, Jee-FuYu, Ming-LungSu, Wei-WenKorphaisarn, KrittiyaManeenil, KunlatidaSamdaengpan, ChayaneeTharavichitkul, EkkapongOzguroglu, MustafaKose, FatihHarputluoglu, HakanBuchschacher, GaryThuluvath, PaulXiong, HenryPatel, MitalGold, PhilipLi, DanengBrooks, GabrielMasood, AshiqPatel, ReemaGeorge, BenSalgia, ReenaManji, GulamCrow, MaryKaseb, AhmedDugan, MatthewKadakia, KunalKardosh, AdelGibbs, JohnShah, AsheshBurris III, HowardHsiehchen, David
18-Nov-2023
2022
 
2022
 
2023
 
3-Apr-2023
 
2023
 
Evaluation and MHz Converter Application of 1.2-kV Vertical GaN JFET
Journal:IEEE Transactions on Power Electronics
2024
Failure Mechanisms of Cascode GaN HEMTs under Overvoltage and Surge Energy Events
Proceeding/Conference:IEEE International Reliability Physics Symposium Proceedings
2021
 
1-Oct-2024
GaN HEMTs in High-Frequency Overvoltage Switching: Electrical or Thermal Failure?
Proceeding/Conference:Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
2023
Gate Lifetime of P-Gate GaN HEMT in Inductive Power Switching
Proceeding/Conference:Proceedings of the International Symposium on Power Semiconductor Devices and ICs
2023
Gate Lifetime of P-Gate GaN HEMT under DC and Switching Overvoltage Stress
Proceeding/Conference:2023 IEEE 10th Workshop on Wide Bandgap Power Devices and Applications, WiPDA 2023
2023
 
2024
Impact of Conduction Current on Output Capacitance Loss in GaN HEMTs
Proceeding/Conference:Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
2023
 
2015
Investigation on Physical Origins of Output Capacitance Loss in Cascode GaN HEMTs
Proceeding/Conference:Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
2023