Showing results 1 to 5 of 5
Title | Author(s) | Issue Date | |
---|---|---|---|
A 2-D threshold-voltage model for small MOSFET with quantum-mechanical effects Proceeding/Conference:2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC | 2006 | ||
2006 | |||
Gate leakage properties of MOS devices with tri-layer high-k gate dielectric Journal:Microelectronics Reliability | 2007 | ||
Metal-phosphorus network on Pt(111) Journal:2D Materials | 2022 | ||
2023 |