Showing results 1 to 3 of 3
Title | Author(s) | Issue Date | |
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Microstructural and magnetic characterization of ion-beam bomdarded [Ni80Fe20-Cr]50 thin films Proceeding/Conference:International Symposium on Next-Generation Electronics (ISNE) | 2014 | ||
Process induced magnetic sensitivity variation in sectorial split-drain magentic field-effect transistor Proceeding/Conference:International Symposium on Next-Generation Electronics (ISNE) | 2014 | ||
Sectorial SD-MAGFET for high speed mechatronic applications Proceeding/Conference:International Symposium on Next-Generation Electronics (ISNE) | 2014 |