Browsing by Author Cheng, YC

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TitleAuthor(s)Issue Date
 
Butyrate mediates nucleotide-binding and oligomerisation domain (NOD) 2-dependent mucosal immune responses against peptidoglycan
Journal:European Journal of Immunology
Leung, CHLam, WMa, DLGullen, EACheng, YC
2009
 
Characterisation and simulation of substrate current in thermally reoxidised-nitrided-oxide n-MOSFET's
Proceeding/Conference:International Semiconductor Device Research Symposium, ISDRS-91
Ma, ZJLai, PTLiu, ZHCheng, YC
1991
 
Characterization of rapid thermally nitrided SiO2/Si interface by the conductance technique
Journal:Applied Physics Letters
Liu, ZHLai, PTCheng, YC
1990
 
Charge trapping and interface state generation by avalanche hot-electron injection in rapid thermal NH3 annealed and reoxidized SiO2 films
Journal:Journal of the Electrochemical Society
Liu, ZHChen, PSCheng, YCLai, PT
1990
 
Chick Sox10, a transcription factor expressed in both early neural crest cells and central nervous system
Journal:Developmental Brain Research
Cheng, YCCheung, MAbuElmagd, MMOrme, AScotting, PJ
2000
 
CIC, a member of a novel subfamily of the HMG-box superfamily, is transiently expressed in developing granule neurons
Journal:Molecular Brain Research
Lee, CJChan, WICheung, MCheng, YCAppleby, VJOrme, ATScotting, PJ
2002
 
Closed-form delay expression for digital BiCMOS circuits with high-injection effects
Journal:IEEE Journal of Solid-State Circuits
Lai, PTCheng, YC
1994
 
Comparison of threshold modulation in narrow MOSFETs with different isolation structures
Journal:Solid-State Electronics
Lai, PTCheng, YC
1985
 
A comparison between NO-annealed O2- and N2O-grown gate dielectrics
Proceeding/Conference:IEEE Hong Kong Electron Devices Meeting Proceedings
Lai, PTXu, JPCheng, YC
1998
 
A comparison between the interface properties of N2O-nitrided and N2O-grown oxides
Journal:Solid-State Electronics
Xu, JPLai, PTCheng, YC
1998
 
Computer simulation of rapid thermal annealing of thermally grown oxide in ammonia ambient
Proceeding/Conference:Techical Digest of 1989 International Conference on VLSI and CAD (ICVC '89)
Lai, PTCheng, YCWong, H.
1989
 
Correlation between hot-carrier-induced interface states and GIDL current increase in N-MOSFET's
Journal:IEEE Transactions on Electron Devices
Lai, PTXu, JPWong, WMLo, HBCheng, YC
1998
 
Deep-depletion-layer impact-ionization-induced gate-oxide breakdown in thin-oxide n-MOSFETs
Journal:Solid-State Electronics
Huang, MQLai, PTMa, ZJWong, HCheng, YC
1993
 
Dynamic-stress-induced enhanced degradation of 1/f noise in n-MOSFET's
Journal:IEEE Transactions on Electron Devices
Xu, JPLai, PTCheng, YC
2000
 
An economical fabrication technique for SIMOX using plasma immersion ion implantation
Min, JChu, PKCheng, YCLiu, JBIyer, SSKCheung, NW
1995
 
Effects of Gate-Pulse Shape on the Accuracy of Charge-Pumping Measurement
Proceeding/Conference:International Conference on VLSI and CAD Proceedings
Lai, PTXu, JPPoek, CKCheng, YC
1997
 
Effects of hole trapping on degradation behaviors in thermally-nitrided oxides under F-N injection
Proceeding/Conference:Proceedings of the 3rd International Conference on Solid State and Integrated Circuit Technology
Lai, PTMa, ZJCheng, YCLiu, BYHuang, MQ
1992
 
Effects of nitridation and annealing on interface properties of thermally oxidized SiO2/SiC metal–oxide–semiconductor system
Journal:Applied Physics Letters
Lai, PTChakraborty, SChan, CLCheng, YC
2000
 
Effects of nitridation and re-oxidation on drain leakage current in n-channel MOSFETs
Proceeding/Conference:Conference on Solid State Devices and Materials
Fleischer, SLiu, ZHLai, PTMa, ZJCheng, YC
1990
 
Effects of nitridation temperature on the electron trap characteristics of nitrided-oxide metal-oxide-semiconductor capacitors
Journal:Journal of Applied Physics
Fleischer, SLai, PTCheng, YC
1993
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