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Showing results 7 to 14 of 14 < previous

	Title	Author(s)	Issue Date
	Mechanism of different switching directions in graphene oxide based RRAM Journal:Journal of the Electrochemical Society	Wang, Zhongrui Tjoa, V.Wu, L.Liu, W. J.Fang, Z.Tran, X. A.Wei, J.Zhu, W. G.Yu, H. Y.	2012
	Nanoscale electrical and physical study of polycrystalline high-κ dielectrics and proposed reliability enhancement techniques Proceeding/Conference:IEEE International Reliability Physics Symposium Proceedings	Shubhakar, K.Pey, K. L.Kushvaha, S. S.Bosman, M.O'Shea, S. J.Raghavan, N.Kouda, M.Kakushima, K.Wang, Z. R.Yu, H. Y.Iwai, H.	2011
	Oxide-based RRAM: A novel defect-engineering-based implementation for multilevel data storage Proceeding/Conference:2012 4th IEEE International Memory Workshop, IMW 2012	Kang, J. F.Gao, B.Chen, B.Liu, L. F.Liu, X. Y.Yu, H. Y.Wang, Z. R.Yu, B.	2012
	Oxide-based RRAM: Unified microscopic principle for both unipolar and bipolar switching Proceeding/Conference:Technical Digest - International Electron Devices Meeting, IEDM	Gao, B.Kang, J. F.Chen, Y. S.Zhang, F. F.Chen, B.Huang, P.Liu, L. F.Liu, X. Y.Wang, Y. Y.Tran, X. A.Wang, Z. R.Yu, H. Y.Chin, Albert	2011
	Positive bias-induced V<inf>th</inf> instability in graphene field effect transistors Journal:IEEE Electron Device Letters	Liu, W. J.Sun, X. W.Fang, Z.Wang, Z. R.Tran, X. A.Wang, F.Wu, L.Ng, G. I.Zhang, J. F.Wei, J.Zhu, H. L.Yu, H. Y.	2012
	Self-rectifying and forming-free unipolar HfO<inf>x</inf> based-high performance RRAM built by fab-avaialbe materials Proceeding/Conference:Technical Digest - International Electron Devices Meeting, IEDM	Tran, X. A.Gao, B.Kang, J. F.Wu, X.Wu, L.Fang, Z.Wang, Z. R.Pey, K. L.Yeo, Y. C.Du, A. Y.Liu, M.Nguyen, B. Y.Li, M. F.Yu, H. Y.	2011
	Temperature instability of resistive switching on HfO<inf>x</inf>-based RRAM devices Journal:IEEE Electron Device Letters	Fang, Z.Yu, H. Y.Liu, W. J.Wang, Z. R.Tran, X. A.Gao, B.Kang, J. F.	2010
	V<inf>th</inf> shift in single-layer graphene field-effect transistors and its correlation with raman inspection Journal:IEEE Transactions on Device and Materials Reliability	Liu, W. J.Sun, X. W.Tran, X. A.Fang, Z.Wang, Z. R.Wang, F.Wu, L.Zhang, J. F.Wei, J.Zhu, H. L.Yu, H. Y.	2012

Showing results 7 to 14 of 14 < previous