Browsing by Author Cheng, YC

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TitleAuthor(s)Issue DateViews
 
Comparison of threshold modulation in narrow MOSFETs with different isolation structures
Journal:Solid-State Electronics
Lai, PTCheng, YC
1985
 
A comparison between NO-annealed O2- and N2O-grown gate dielectrics
Proceeding/Conference:IEEE Hong Kong Electron Devices Meeting Proceedings
Lai, PTXu, JPCheng, YC
1998
131
 
A comparison between the interface properties of N2O-nitrided and N2O-grown oxides
Journal:Solid-State Electronics
Xu, JPLai, PTCheng, YC
1998
104
 
Computer simulation of rapid thermal annealing of thermally grown oxide in ammonia ambient
Proceeding/Conference:Techical Digest of 1989 International Conference on VLSI and CAD (ICVC '89)
Lai, PTCheng, YCWong, H.
1989
28
 
Correlation between hot-carrier-induced interface states and GIDL current increase in N-MOSFET's
Journal:IEEE Transactions on Electron Devices
Lai, PTXu, JPWong, WMLo, HBCheng, YC
1998
399
 
Deep-depletion-layer impact-ionization-induced gate-oxide breakdown in thin-oxide n-MOSFETs
Journal:Solid-State Electronics
Huang, MQLai, PTMa, ZJWong, HCheng, YC
1993
 
Dynamic-stress-induced enhanced degradation of 1/f noise in n-MOSFET's
Journal:IEEE Transactions on Electron Devices
Xu, JPLai, PTCheng, YC
2000
107
 
An economical fabrication technique for SIMOX using plasma immersion ion implantation
Min, JChu, PKCheng, YCLiu, JBIyer, SSKCheung, NW
1995
130
 
Effects of Gate-Pulse Shape on the Accuracy of Charge-Pumping Measurement
Proceeding/Conference:International Conference on VLSI and CAD Proceedings
Lai, PTXu, JPPoek, CKCheng, YC
1997
 
Effects of hole trapping on degradation behaviors in thermally-nitrided oxides under F-N injection
Proceeding/Conference:Proceedings of the 3rd International Conference on Solid State and Integrated Circuit Technology
Lai, PTMa, ZJCheng, YCLiu, BYHuang, MQ
1992
38
 
Effects of nitridation and annealing on interface properties of thermally oxidized SiO2/SiC metal–oxide–semiconductor system
Journal:Applied Physics Letters
Lai, PTChakraborty, SChan, CLCheng, YC
2000
 
Effects of nitridation and re-oxidation on drain leakage current in n-channel MOSFETs
Proceeding/Conference:Conference on Solid State Devices and Materials
Fleischer, SLiu, ZHLai, PTMa, ZJCheng, YC
1990
 
Effects of nitridation temperature on the electron trap characteristics of nitrided-oxide metal-oxide-semiconductor capacitors
Journal:Journal of Applied Physics
Fleischer, SLai, PTCheng, YC
1993
176
 
Electrical characterization and simulation of substrate current in n-MOSFETs with nitrided/reoxidized-nitrided oxides as gate dielectrics
Journal:Solid-State Electronics
Ma, ZJLai, PTCheng, YC
1992
172
 
Electrical properties of different NO-annealed oxynitrides
Proceeding/Conference:Journal of Non-Crystalline Solids
Xu, JPLai, PTCheng, YC
1999
168
 
Electron trapping and detrapping behaviors of thin thermally nitrided oxides
Proceeding/Conference:Techical Digest of 1989 International Conference on VLSI and CAD (ICVC '89)
Lai, PTWong, HCheng, YCLo, HBLiu, ZH
1989
30
 
Energy levels of interface states generated in n-MOSFETs by hot-carrier stresses
Journal:Solid-State Electronics
Xu, JPLai, PTCheng, YC
2000
166
 
Enhancement of 1/f noise degradation in n-MOSFETs under AC hot-carrier stress
Proceeding/Conference:Proceedings of 15th International Conference Noise in Physical Systems and 1/f Fluctuations
Lai, PTXu, JCheng, YC
1999
 
Eriocalyxin B inhibits nuclear factor-κB activation by interfering with the binding of both p65 and p50 to the response element in a noncompetitive manner
Journal:Molecular Pharmacology
Leung, CHGrill, SPLam, WGao, WSun, HDCheng, YC
2006
71
 
Expression of deoxynucleotide carrier is not associated with the mitochondrial DNA depletion caused by anti-HIV dideoxynucleoside analogs and mitochondrial dNTP uptake
Journal:Molecular Pharmacology
Lam, WChen, CRuan, SLeung, CHCheng, YC
2005
80
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