Browsing by Author XU, JP

Jump to: 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
Showing results 50 to 58 of 58 < previous 
TitleAuthor(s)Issue DateViews
 
2019
22
 
2016
 
2015
58
 
2015
34
 
A simplified post-soft-breakdown current model for MOS devices
Journal:Applied Physics A: Materials Science and Processing
2009
 
Suppressed growth of interlayer GeO x in Ge MOS capacitors with gate dielectric prepared in wet NO ambient
Proceeding/Conference:IEEE Conference on Electron Devices and Solid-State Circuits (EDSSC) Proceedings
2005
80
 
2019
7
 
2007
91
Threshold voltage model of SiGe channel pMOSFET without Si cap layer
Proceeding/Conference:2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC
2006
57